Applied Physics Letters

Vol. 129, Issue 5 Issue 5 2026
55
Articles

Articles in this Issue

Internal-loss-limited 5.5% wall-plug efficiency in index-guided AlGaN UV-B laser diodes with polarization-doped cladding layers

Rintaro Miyake, Takumu Saito, Shion Kamiya et al. Aug 03, 2026 10.1063/5.0341819

This study identifies the dominant factor governing wall-plug efficiency (WPE) in AlGaN-based UV-B laser diodes. While previous studies have mainly focused on optical confinement, the limiting mechani...

Stable asymmetric magnetization reversal in epitaxial Co(001)/CoO(001) bilayer

Maik Gaerner, Judith Bünte, Finn Peters et al. Aug 03, 2026 10.1063/5.0336305

The exchange bias (EB) in ferromagnetic/antiferromagnetic (FM/AFM) bilayer systems causes a shift in the magnetic hysteresis curve after field cooling through the Néel temperature of the AFM. In some...

Separating intrinsic and domain-mediated anomalous Hall conductivity in Co3Sn2S2 via contact engineering

Eddy Divin Kenvo Songwa, Shaday Jesus Nobosse Nguemeta, Hodaya Gabber et al. Aug 03, 2026 10.1063/5.0337406

Separating the momentum-space intrinsic Berry-curvature contribution to the anomalous Hall conductivity (AHC) from domain-mediated and extrinsic contributions in bulk ferromagnetic Weyl semimetals rem...

<i>In situ</i> electric field-assisted curing enables low dielectric constant and loss through polarization suppression

Tengyu Li, Liuyin Li, Jiayu Su et al. Aug 03, 2026 10.1063/5.0303440

Low-dielectric materials are crucial for reducing RC delay in high-density integrated circuits. Here, we report an electric field-assisted in situ curing strategy for dicyclopentadiene-based epoxy fil...

Homoepitaxial GaN-on-GaN trench MOSFETs with 438 MW/cm2 figure of merit and improved gate reliability

Xuancong Fan, Renqiang Zhu, HaoWen Luo et al. Aug 03, 2026 10.1063/5.0325399

In this paper, we report enhanced high-voltage blocking capability and improved gate dielectric reliability in vertical GaN-on-GaN trench metal–oxide–semiconductor field-effect transistors (MOSFETs) t...

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Journal Info

Publisher American Institute of Physics
ISSN 0003-6951
E-ISSN 1077-3118
Subject Physical Sciences
Language English
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