Applied Physics Letters

Vol. 127, Issue 20 Issue 20 2025
55
Articles

Articles in this Issue

A laser-based system for real-time detection of toxic elements in aerosols and gases

Nils Dietrich, Canan Yagmur Boynukara, Elias Catrix et al. Nov 17, 2025 10.1063/5.0283797

High-sensitivity material analysis techniques, relying on conventional (radio frequency-based and electrostatic) particle accelerators, such as particle-induced x-ray emission and particle-induced gam...

Erratum: “Continuously tunable uniaxial strain engineering of two-dimensional materials under scanning probe microscopy” [Appl. Phys. Lett. <b>127</b> , 093503 (2025)]

Ze Zhang, Jiawei Huang, Yiqi Zhang et al. Nov 17, 2025 10.1063/5.0308835

Introducing ultrafast EBIC: Spatially resolved transient analysis of an avalanche photodiode

J. Rehmann, M. Röllin, A. Vaterlaus et al. Nov 17, 2025 10.1063/5.0293783

We present ultrafast electron-beam-induced current (EBIC) measurements using an ultrafast scanning electron microscope (USEM) to investigate picosecond-scale transient behavior in semiconductor device...

Polarization-encoded Kramers–Kronig single-path interferometer to unscramble a twisted wavefront

Tushar Sarkar, Yizhe Li, Jiapeng Cai et al. Nov 17, 2025 10.1063/5.0299511

We propose and experimentally demonstrate a single-shot approach to unscrambling a twisted wavefront, leveraging a single-path interferometer and the Kramers–Kronig (KK) relation. In a single-path int...

Ohmic contact at 2D Bi2O2Se/TaNiTe5 interface via self-modulation doping

Yu Zhao, Wen-Feng Li, Peize Yuan et al. Nov 17, 2025 10.1063/5.0302332

The quasi-2D Bi2O2Se has become a rising star in channel materials, but its contact resistance (RC) with metal still lags behind the requirements for advanced technology nodes. Here, ultra-low Schottk...

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Journal Info

Publisher American Institute of Physics
ISSN 0003-6951
E-ISSN 1077-3118
Subject Physical Sciences
Language English
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