Erratum: “Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films” [Appl. Phys. Lett. <b>124</b>, 252905 (2024)]
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (8)
Liron Shvilberg
Department of Materials Science and Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,
Chuanzhen Zhou
Analytical Instrumentation Facility, North Carolina State University 2 , Raleigh, North Carolina 27695,
Megan K. Lenox
Department of Materials Science and Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,
Benjamin L. Aronson
Department of Materials Science and Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,
Nicolas K. Lam
Department of Materials Science and Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,
Samantha T. Jaszewski
Department of Materials Science and Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,
Elizabeth J. Opila
Department of Materials Science and Engineering, University of Virginia
Jon F. Ihlefeld
Department of Materials Science and Engineering, University of Virginia 2 , Charlottesville, Virginia 22904,