Velocity and temperature dependent adhesion and friction in mesoscale graphite contacts

C Chenxu Liu (College of Chemistry and Molecular Sciences) G Gautham Vijayan (Nanoscale Electronic Materials and Devices Laboratory, Faculty of Materials Science and Engineering, Technion—Israel Institute of Technology , Haifa 3200003,) M Michael Uzhansky (Nanoscale Electronic Materials and Devices Laboratory, Faculty of Materials Science and Engineering, Technion—Israel Institute of Technology , Haifa 3200003,) E Elad Koren (Department of Materials Science and Engineering, Technion-Israel Institute of Technology 2 , Haifa 3200003,)

Abstract

The weak interlayer binding in two-dimensional layered materials such as graphite has been the subject of intensive experimental investigation and modeling for structural superlubric and electronic devices. Yet, the effects of sliding velocity and temperature on the interfacial lateral forces in mesoscale contacts are poorly understood. Here, we report experiments of friction and adhesion forces in atomically pristine mesoscopic superlubric graphite, conducted over a range of sliding velocities and temperatures. It is shown that the friction force, temperature, and velocity follow the linear correlation of (Fc−F)3/2/T vs ln(v/T), which intriguingly aligns well with the thermally activated Prandtl–Tomlinson model associated with single asperity contacts. Moreover, when the velocity is lower than 2500 nm/s and the friction force approaches zero, the adhesive force increases with velocity and decreases with increasing temperature, indicating a thermally activated exfoliation process. Our results demonstrate that in cases where the interface is constrained to be atomically flat, mesoscale contacts can manifest single asperity force characteristics, where the sliding interface is collectively affected by thermal energy.

Article Details

Volume / Issue Vol. 127, Issue 3
Published July 21, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (4)

C

Chenxu Liu

College of Chemistry and Molecular Sciences

G

Gautham Vijayan

Nanoscale Electronic Materials and Devices Laboratory, Faculty of Materials Science and Engineering, Technion—Israel Institute of Technology , Haifa 3200003,

M

Michael Uzhansky

Nanoscale Electronic Materials and Devices Laboratory, Faculty of Materials Science and Engineering, Technion—Israel Institute of Technology , Haifa 3200003,

E

Elad Koren

Department of Materials Science and Engineering, Technion-Israel Institute of Technology 2 , Haifa 3200003,