Thermal transport in <b> <i>γ</i> </b> -InSe: Bulk single crystals and thin flakes

F Farjana Ferdous Tonni (Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,) M Maliha Maliat (Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,) S Sujit Bati (Department of Physics, University of Virginia 2 , Charlottesville, Virginia 22904,) M Md Sabbir Akhanda (Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,) H Harsh Chandra (Institute of Engineering Innovation 3 , University of Tokyo, Tokyo 113-8656,) E Ethan A. Scott A Abir Hasan (Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,) S Sergiy Krylyuk (Material Science and Engineering Division, National Institute of Standards and Technology 5 , Gaithersburg, Maryland 20899,) N Nikhil Shukla (Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,) C Costel Constantin (Department of Physics and Astronomy, James Madison University 6 , Harrisonburg, Virginia 22807,) P Patrick E. Hopkins J Junichiro Shiomi (Institute of Engineering Innovation, School of Engineering, The University of Tokyo) A Albert V. Davydov (Material Science and Engineering Division, National Institute of Standards and Technology 5 , Gaithersburg, Maryland 20899,) M Mona Zebarjadi

Abstract

We measure the temperature-dependent in-plane thermal conductivity, κ∥(T), of high-purity γ-InSe bulk single crystals and exfoliated thin flakes (30–50 nm) from 50 to 300 K. Our bulk results agree with prior bulk reports and provide a reproducible reference for phonon transport. In the literature, cross-plane thermal conductivity of supported InSe flakes shows relatively modest variation, whereas reported room-temperature in-plane values for supported flakes span a wide range, including outliers that exceed bulk despite much smaller thickness. In our measurements, the flake κ∥ at room temperature is lower than bulk, as expected, but exhibits substantial sample-to-sample variability; despite being thinner, intrinsic flakes show higher κ∥ than doped flakes, consistent with reduced impurity scattering and improved flake uniformity. We analyze our data using a Callaway-type phonon-scattering model in which substrate interactions (including plausible strain-related renormalization of acoustic parameters) contribute to the observed spread near room temperature. However, below ∼150 K, the measured trends cannot be captured without invoking changes in sound velocity far larger than realistic strain levels, indicating that additional mechanisms beyond simple strain renormalization are required at low temperature. These measurements provide low-temperature κ∥ benchmarks for γ-InSe flakes and constrain how much of the reported room-temperature spread can be explained by thickness, nonuniformity, and substrate effects alone.

Article Details

Volume / Issue Vol. 128, Issue 18
Published May 04, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (14)

F

Farjana Ferdous Tonni

Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,

M

Maliha Maliat

Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,

S

Sujit Bati

Department of Physics, University of Virginia 2 , Charlottesville, Virginia 22904,

M

Md Sabbir Akhanda

Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,

H

Harsh Chandra

Institute of Engineering Innovation 3 , University of Tokyo, Tokyo 113-8656,

E

Ethan A. Scott

A

Abir Hasan

Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,

S

Sergiy Krylyuk

Material Science and Engineering Division, National Institute of Standards and Technology 5 , Gaithersburg, Maryland 20899,

N

Nikhil Shukla

Department of Electrical and Computer Engineering, University of Virginia 1 , Charlottesville, Virginia 22904,

C

Costel Constantin

Department of Physics and Astronomy, James Madison University 6 , Harrisonburg, Virginia 22807,

P

Patrick E. Hopkins

J

Junichiro Shiomi

Institute of Engineering Innovation, School of Engineering, The University of Tokyo

A

Albert V. Davydov

Material Science and Engineering Division, National Institute of Standards and Technology 5 , Gaithersburg, Maryland 20899,

M

Mona Zebarjadi