Temperature-dependent random telegraph signal in Co/CoO/Co point contact devices

Abstract

Nanoscale Co/CoO/Co point contact devices are promising for spintronics, magnetic sensors, single-electron transistors, and memory devices. We fabricated Co/CoO/Co point contact devices and studied their random telegraph signal (RTS) characteristics at various temperatures. In the time domain, the current fluctuates asymmetrically with respect to zero bias, with RTS behavior emerging above a certain voltage threshold. In the frequency domain, the RTS power spectral density exhibits Lorentzian lines. As temperature increases from 50 to 300 K, two RTS behaviors are observed: at ≤100 K, the high current state dominates; at ≥200 K, the low current state prevails, with RTS absent at 150 K. Single exponential fitting shows that RTS state lifetimes decrease with temperature. The charge capture and release model explains the RTS origins and temperature-dependent behavior from an energy band perspective. This study provides insights into charge dynamics, single-electron transport, and the noise mechanisms affecting the reliability of nanoscale devices.