Study of Au doping processing for high quality extrinsic doped n on p HgCdTe detector

D Dapeng Jin (National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,) Z Zhikai Gan (National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,) S Songmin Zhou (National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,) X Xi Wang Q Quanzhi Sun (National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,) X Xun Li L Liqi Zhu C Chun Lin

Abstract

Au, the most pivotal dopant in n-on-p HgCdTe technology, exhibits intricate interactions with Hg vacancy. Understanding this interaction is essential for the fabrication of Au-doped HgCdTe infrared detectors. In this study, we examined the diffusion properties of Au atoms in vacancy-doped HgCdTe utilizing secondary ion mass spectrometry and variable-temperature Hall measurements. The results indicate that Au atoms in interstitial sites rapidly diffuse into HgCdTe, continuing until they occupy vacancy sites and act as acceptors. Infrared detectors doped with Au via this approach exhibited an order of decrease in the dark current density compared to vacancy-doped counterparts, suggesting that Au atoms almost occupy Hg vacancies, achieving effective incorporation.

Article Details

Volume / Issue Vol. 126, Issue 19
Published May 12, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (8)

D

Dapeng Jin

National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,

Z

Zhikai Gan

National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,

S

Songmin Zhou

National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,

X

Xi Wang

Q

Quanzhi Sun

National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences 1 , 500 Yutian Road, Shanghai 200083,

X

Xun Li

L

Liqi Zhu

C

Chun Lin