Structure-defined molecular heat transport in a two-dimensional conjugated metal–organic framework

W Weibo Yan (Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,) J Jinxin Liu (Department of Chemistry) Y Yijie Zhou (Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,) M Mihir Chandra (Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,) J Jiawei Zhou A Aaron Schmidt (Fourier Scientific LLC 4 , 128 Magazine St., 12A, Cambridge, Massachusetts 02139,) C Chase Borges (Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,) R Renhao Dong X Xinliang Feng Y Yanfei Xu (Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,)

Abstract

Understanding thermal transport in two-dimensional metal–organic frameworks (2D MOFs) is of both fundamental and technological importance. Although coordination chemistry and framework architecture offer powerful parameters for tuning heat transport, experimental studies of thermal transport in 2D MOFs remain scarce. Here, we investigate thermal transport in structure-defined 2D MOFs to establish structure–property relationships linking coordination chemistry and framework architecture to heat transport. As a model system, Co–BHT (Co = cobalt, BHT = benzenehexathiolate) thin films are studied. Thickness-dependent measurements using frequency-domain thermoreflectance quantify the thermal conductivity of Co–BHT thin films grown by modified chemical vapor deposition on Si/SiO2 substrates. Using a gold transducer layer, we determine the total thermal interfacial resistance, which includes contributions from the Au/Co–BHT, Co–BHT/SiO2, and SiO2/Si interfaces. The cross-plane thermal conductivity of Co–BHT thin films is determined to be ∼0.26 W m−1 K−1. The films exhibit a nearly isotropic structure without preferred crystal orientation, indicating that the measured cross-plane thermal conductivity reflects isotropic heat transport. The measured thickness-independent total thermal resistance of 4.25 × 10−7 m2 K W−1 arises from combined interfacial resistances and intrinsic resistances of the Au and SiO2 layers, together with thermal spreading in the Si substrate. These results provide quantitative insight into thermal transport in 2D MOFs.

Article Details

Volume / Issue Vol. 128, Issue 19
Published May 11, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (10)

W

Weibo Yan

Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,

J

Jinxin Liu

Department of Chemistry

Y

Yijie Zhou

Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,

M

Mihir Chandra

Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,

J

Jiawei Zhou

A

Aaron Schmidt

Fourier Scientific LLC 4 , 128 Magazine St., 12A, Cambridge, Massachusetts 02139,

C

Chase Borges

Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,

R

Renhao Dong

X

Xinliang Feng

Y

Yanfei Xu

Department of Mechanical and Industrial Engineering, University of Massachusetts 1 , Amherst, Massachusetts 01003,