Spinel CoFe2O4/NiFe2O4 bilayer thin films with enhanced resistive switching and magnetic modulation

W Wanzhi Xiao (State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering, Sun Yat-Sen University , Guangzhou 510006,) Z Zhuoyang Lou (State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering, Sun Yat-Sen University , Guangzhou 510006,) Q Qi Liao N Ni Qin (State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering) D Dinghua Bao (State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering, Sun Yat-Sen University , Guangzhou 510006,)

Abstract

Designing multilayer resistive switching (RS) structure is an effective strategy to enhance resistive random-access memory performance. However, studies employing bilayer spinel oxides remain limited. In this work, CoFe2O4/NiFe2O4 bilayer thin films were fabricated via sol-gel spin-coating to enhance their resistive and magnetic modulation behaviors. Compared with single-layer devices, the bilayer devices show superior RS performance, including improved voltage uniformity, stable endurance, and reliable data retention, which is largely insensitive to the deposition sequence. As a result of the bilayer structural design, the devices demonstrate markedly enhanced switching behavior, attributed to the rupture of oxygen vacancy-type conductive filaments being confined to the interface of the bilayer film. Besides RS, the bilayer films exhibit magnetic anisotropy and their saturation magnetization is enhanced owing to an increase in oxygen vacancies. The results offer valuable insights into bilayer engineering in spinel oxides, with potential applications in non-volatile memory and multifunctional magnetoelectric devices.

Article Details

Volume / Issue Vol. 128, Issue 21
Published May 25, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (5)

W

Wanzhi Xiao

State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering, Sun Yat-Sen University , Guangzhou 510006,

Z

Zhuoyang Lou

State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering, Sun Yat-Sen University , Guangzhou 510006,

Q

Qi Liao

N

Ni Qin

State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering

D

Dinghua Bao

State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials Science and Engineering, Sun Yat-Sen University , Guangzhou 510006,