Skyrmion deformation under the antiferromagnetic system

X Xiuzhu Wang (Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology 1 , Hong Kong SAR,) Z Zehan Chen (Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology 1 , Hong Kong SAR,) Q Qiming Shao

Abstract

A magnetic skyrmion exhibits topological protection property, making it a highly promising candidate as an information carrier in spintronic devices. However, this information carrier may face deformation issues when driven by high current densities, causing the unstable message transmission. In this work, we explore the skyrmion deformation under different magnetic systems, including ferromagnetic, ferrimagnetic, and antiferromagnetic (AFM) systems. We conduct micromagnetic simulations and provide a theoretical analysis of AFM skyrmion deformation, where the skyrmion demonstrates the lowest susceptibility to deformation. We derive a canting term based on the Thiele equation, pointing out an essential term that explains the AFM deformation depression reason. This finding also indicates that the AFM system offers superior stability for skyrmion, making it a promising choice for better option for skyrmion-based spintronics devices.

Article Details

Volume / Issue Vol. 126, Issue 11
Published March 01, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (3)

X

Xiuzhu Wang

Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology 1 , Hong Kong SAR,

Z

Zehan Chen

Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology 1 , Hong Kong SAR,

Q

Qiming Shao