Single-shot multi-plane coherent diffraction imaging with an anisotropic photon-sieve splitter
Abstract
Coherent diffraction imaging (CDI) is a promising high-precision imaging technique with broad applications in fields such as biology and materials science. However, CDI typically requires multiple diffraction patterns at different recording planes for image reconstruction, which is traditionally achieved through mechanical or electronic scanning along the diffraction direction. This study proposes a single-shot multi-plane CDI method utilizing axially and radially separated focal spots from an anisotropic photon-sieve (PS) splitter, in which diffraction distances in the system depend solely on the focal lengths of the PS. This single-shot imaging method eliminates the need for scanning measurements, making it well-suited for dynamic detection and other applications demanding high real-time requirements. In the experiment, multiple test objects were used to validate feasibility of the imaging method. Owing to amplitude-only PS, the proposed method can be adapted to wavelengths ranging from x rays to extreme ultraviolet, providing the possibility for the single-shot measurement and imaging in the short-wavelength region.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (8)
Huaiyu Cui
National Key Laboratory of Laser Spatial Information, Harbin Institute of Technology , Harbin 150006,
Keyang Cheng
National Key Laboratory of Laser Spatial Information, Harbin Institute of Technology 1 , Harbin 150080,
Junyong Zhang
Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences 2 , Shanghai 201800,
Junchi Wu
State Key Laboratory of Precision and Intelligent Chemistry, CAS Key Laboratory of Mechanical Behavior and Design of Materials
Ziyi Zhang
Qi Li
Yongpeng Zhao
Dongdi Zhao
National Key Laboratory of Laser Spatial Information, Harbin Institute of Technology , Harbin 150006,