Simple approach for optical sectioning enhancement in epi-illumination line-scan confocal microscopy

K Kye-Sung Lee (Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,) S Sangwon Hyun (Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,) H Hwan Hur (Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,) J Ji Yong Bae (Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,) I I Jong Kim (Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,) N Naresh Kumar Ravichandran (Department of Engineering Design, Indian Institute of Technology Madras 2 , Chennai 600036, Tamil Nadu,)

Abstract

We report the implementation of temporally modulated scanning illumination to enhance optical sectioning in epi-illumination line-scan confocal microscopy. By applying a sinusoidal intensity modulation with a spatial period set to twice the line beam width, and synchronizing the pixel exposure time to the modulation period via rolling shutter control, our method improves the contrast of in-focus signals while effectively suppressing out-of-focus background fluorescence. We demonstrate enhanced sectioning performance through volumetric fluorescence imaging of three samples with different thicknesses: 15 µm fluorescent beads, a ∼30 µm-thick corn grain section, and a ∼180 µm optically cleared mouse kidney. This simple yet practical approach extends the sectioning capability of conventional epi-illumination line-scan confocal systems without requiring hardware modifications, offering a promising solution for high-contrast three-dimensional imaging of thick biological specimens such as organoids.

Article Details

Volume / Issue Vol. 128, Issue 1
Published January 05, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (6)

K

Kye-Sung Lee

Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,

S

Sangwon Hyun

Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,

H

Hwan Hur

Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,

J

Ji Yong Bae

Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,

I

I Jong Kim

Center for Scientific Instrumentation, Korea Basic Science Institute 1 , Daejeon 34133,

N

Naresh Kumar Ravichandran

Department of Engineering Design, Indian Institute of Technology Madras 2 , Chennai 600036, Tamil Nadu,