Sensitive x-ray and extended near-infrared detection with doped perovskite single crystal
Abstract
Conventional all-inorganic perovskite photodetectors typically exhibit photoresponse limited to the visible region (<800 nm). In this work, we demonstrate a broadband photodetection strategy by introducing Fe dopants into Cs2AgBiBr6 double perovskites, extending the spectral response to ∼1200 nm in the near-infrared (NIR) region. These states enable sub-bandgap photon absorption through transitions involving these defect-induced energy levels, thereby facilitating NIR detection. Furthermore, the Fe-doped Cs2AgBiBr6 (Fe:Cs2AgBiBr6) devices do not compromise the intrinsic X-ray detection performance of Cs2AgBiBr6 while enabling a pronounced enhancement in NIR photoresponse. This study provides an effective doping-driven approach to broaden the operational spectral range of all-inorganic perovskite photodetectors and highlights the potential of defect-state engineering for multifunctional optoelectronic applications.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (15)
Ruolong Zhou
Beijing National Research Center for Information Science and Technology (BNRist), School of Integrated Circuits, Tsinghua University 1 , Beijing 100084,
Xiangshun Geng
Beijing National Research Center for Information Science and Technology (BNRist), School of Integrated Circuits, Tsinghua University 1 , Beijing 100084,
Xiao Liu
Jiahe Zhang
State Key Laboratory of Natural and Biomimetic Drugs, School of Pharmaceutical Sciences, Peking University
Guanhua Dun
Beijing National Research Center for Information Science and Technology (BNRist), School of Integrated Circuits, Tsinghua University 1 , Beijing 100084,
Yida Gao
Beijing National Research Center for Information Science and Technology (BNRist), School of Integrated Circuits, Tsinghua University 1 , Beijing 100084,
Zi Wang
Hexuan Wang
Beijing National Research Center for Information Science and Technology (BNRist), School of Integrated Circuits, Tsinghua University 1 , Beijing 100084,
Rui Zhao
Jinjie Wu
Gongrong Deng
National Key Laboratory of Infrared Detection Technologies, Kunming Institute of Physics 3 , Kunming 650223,
He Tian
Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, China.
Yi Yang
Dan Xie
Tian-Ling Ren