Raman-integrated scanning electrochemical cell microscopy for <i>operando</i> localized spectroelectrochemistry

A Akichika Kumatani (Advanced Institute for Materials Research (WPI‐AIMR) Tohoku University Sendai 980‐8577 Japan) E Eita Tachizaki (Department of Electrical and Electronic Engineering, Chiba Institute of Technology 1 , Chiba 275-0016,) R Ryonosuke Ishige (Department of Electrical and Electronic Engineering, Chiba Institute of Technology 1 , Chiba 275-0016,) H Hiroki Ida (Graduate School of Engineering, Nagoya University 5 , Aichi 464-8603,) Y Yasufumi Takahashi (Graduate School of Engineering, Nagoya University 5 , Aichi 464-8603,) S Susumu Shiraki (Department of Sustainable and Biological Chemistry, Nippon Institute of Technology 7 , Saitama 345-8501,) H Hitoshi Shiku (Graduate School of Engineering Tohoku University 6‐6‐11 Aramaki‐aza Aoba, Aoba‐ku Sendai 980‐8579 Japan)

Abstract

Scanning electrochemical cell microscopy (SECCM) utilizes a meniscus formed between the sample surface and the tip of a glass pipette filled with electrolyte as a confined electrochemical cell, enabling highly localized electrochemical measurement. However, SECCM alone makes it challenging to monitor chemical structure changes that accompany electrochemical reactions. In this study, we developed an in operando measurement system that integrates Raman spectroscopy with an electrochemical probe of the SECCM system, allowing simultaneous acquisition of localized electrochemical and spectroscopic data. A single crystal flakes of LiFePO4, a cathode material for lithium-ion batteries, was prepared, and changes in Raman scattering during lithium-ion charge/discharge processes were successfully monitored through the meniscus formed on their surfaces. This combined system provides nanoscale insights into electrochemical reactions and the associated structural transformations.

Article Details

Volume / Issue Vol. 128, Issue 16
Published April 20, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

A

Akichika Kumatani

Advanced Institute for Materials Research (WPI‐AIMR) Tohoku University Sendai 980‐8577 Japan

E

Eita Tachizaki

Department of Electrical and Electronic Engineering, Chiba Institute of Technology 1 , Chiba 275-0016,

R

Ryonosuke Ishige

Department of Electrical and Electronic Engineering, Chiba Institute of Technology 1 , Chiba 275-0016,

H

Hiroki Ida

Graduate School of Engineering, Nagoya University 5 , Aichi 464-8603,

Y

Yasufumi Takahashi

Graduate School of Engineering, Nagoya University 5 , Aichi 464-8603,

S

Susumu Shiraki

Department of Sustainable and Biological Chemistry, Nippon Institute of Technology 7 , Saitama 345-8501,

H

Hitoshi Shiku

Graduate School of Engineering Tohoku University 6‐6‐11 Aramaki‐aza Aoba, Aoba‐ku Sendai 980‐8579 Japan