Probing magneto-thermoelectric transport in magnetic thin films using lock-in thermography under a varying DC offset

X Xiaoyi Gu (School of Mechanical Engineering, Nanjing University of Science and Technology 1 , Nanjing 210094,) X Xiaodong Zhang (Hefei National Research Center for Physical Sciences at the Microscale) Y Yuxin Si (Department of Electrical and Computer Engineering, National University of Singapore 1 , 4 Engineering Drive 3, 117583) T Tingxuan Zhang (Department of Electrical and Computer Engineering, National University of Singapore 1 , 4 Engineering Drive 3, 117583) H Hang Xie J Jiaqi Wang Y Yihong Wu (College of Chemistry and Chemical Engineering)

Abstract

Lock-in thermography (LIT) is a powerful tool for studying magneto-thermoelectric effects in magnetic materials. While most studies have focused on thick or bulk films with negligible DC offset-induced Joule heating, systematic studies of the DC offset effect in thin films have been lacking. Here, we investigate the anomalous Ettingshausen effect (AEE) in magnetic thin films, including Ni(10 nm), CoFeB(6 nm), and CoFeB(6 nm)/Ru(0.6 nm)/Ni(10 nm) synthetic antiferromagnets, using the LIT under varying DC offset and magnetic field conditions. We show theoretically that, instead of adversely affecting LIT measurements, an intentionally introduced DC offset with moderate magnitude facilitates the extraction of AEE signals, which is verified experimentally through measurement of hysteresis loops of different types of U-shaped samples. Our findings show LIT's potential for studying magneto-thermoelectric effects in single- and multilayer structures over a broad thickness range, beyond just thick films.

Article Details

Volume / Issue Vol. 127, Issue 14
Published October 06, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

X

Xiaoyi Gu

School of Mechanical Engineering, Nanjing University of Science and Technology 1 , Nanjing 210094,

X

Xiaodong Zhang

Hefei National Research Center for Physical Sciences at the Microscale

Y

Yuxin Si

Department of Electrical and Computer Engineering, National University of Singapore 1 , 4 Engineering Drive 3, 117583

T

Tingxuan Zhang

Department of Electrical and Computer Engineering, National University of Singapore 1 , 4 Engineering Drive 3, 117583

H

Hang Xie

J

Jiaqi Wang

Y

Yihong Wu

College of Chemistry and Chemical Engineering