Probing magneto-thermoelectric transport in magnetic thin films using lock-in thermography under a varying DC offset
Abstract
Lock-in thermography (LIT) is a powerful tool for studying magneto-thermoelectric effects in magnetic materials. While most studies have focused on thick or bulk films with negligible DC offset-induced Joule heating, systematic studies of the DC offset effect in thin films have been lacking. Here, we investigate the anomalous Ettingshausen effect (AEE) in magnetic thin films, including Ni(10 nm), CoFeB(6 nm), and CoFeB(6 nm)/Ru(0.6 nm)/Ni(10 nm) synthetic antiferromagnets, using the LIT under varying DC offset and magnetic field conditions. We show theoretically that, instead of adversely affecting LIT measurements, an intentionally introduced DC offset with moderate magnitude facilitates the extraction of AEE signals, which is verified experimentally through measurement of hysteresis loops of different types of U-shaped samples. Our findings show LIT's potential for studying magneto-thermoelectric effects in single- and multilayer structures over a broad thickness range, beyond just thick films.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (7)
Xiaoyi Gu
School of Mechanical Engineering, Nanjing University of Science and Technology 1 , Nanjing 210094,
Xiaodong Zhang
Hefei National Research Center for Physical Sciences at the Microscale
Yuxin Si
Department of Electrical and Computer Engineering, National University of Singapore 1 , 4 Engineering Drive 3, 117583
Tingxuan Zhang
Department of Electrical and Computer Engineering, National University of Singapore 1 , 4 Engineering Drive 3, 117583
Hang Xie
Jiaqi Wang
Yihong Wu
College of Chemistry and Chemical Engineering