Polyhydroxy organic molecule-cross-linked polyvinylidene fluoride with enhanced breakdown strength and energy density

H Hao Ren X Xiaoyi Zhang S Shuxuan Li (School of Materials and Microelectronics & Center of Smart Materials and Devices, State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology , Wuhan 430070,) Z Zhonglin Wang (Beijing Institute of Nanoenergy and Nanosystems) Z Zhi Li J Juntao Zhou (School of Materials and Microelectronics & Center of Smart Materials and Devices, State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology , Wuhan 430070,) X Xin Zhen X Xin Zhang

Abstract

Polyvinylidene fluoride (PVDF) has been extensively studied for dielectric energy storage applications owing to its excellent dielectric properties. There remains a persistent demand to enhance its breakdown strength and achieve higher energy storage density. In this work, a hydrogen-bonding cross-linking strategy is demonstrated to effectively enhance the breakdown strength and energy storage performance of PVDF. Tris(hydroxymethyl)nitromethane (THNM), containing multiple hydroxyl groups, was employed as a cross-linking agent to form multiple hydrogen bonds with the C–F groups in PVDF chains via a facile solution-casting process. The establishment of a hydrogen-bonding cross-linked network significantly enhances the mechanical strength and introduces charge traps into the PVDF matrix, thereby increasing the breakdown strength from 572 MV/m for the pristine PVDF film to 744 MV/m for the THNM-cross-linked-PVDF film (T-c-PVDF). Consequently, the T-c-PVDF film achieves a high energy storage density of 21.83 J/cm3, representing a 150% improvement over the pure PVDF film, while maintaining a charge–discharge efficiency exceeding 70%, and the energy storage performance stands out among PVDF-based dielectric materials from state-of-the-art works. This work highlights the significant potential of constructing a hydrogen-bonding cross-linked network within dielectric polymers in enhancing their breakdown strength and energy storage performance.

Article Details

Volume / Issue Vol. 128, Issue 15
Published April 13, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (8)

H

Hao Ren

X

Xiaoyi Zhang

S

Shuxuan Li

School of Materials and Microelectronics & Center of Smart Materials and Devices, State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology , Wuhan 430070,

Z

Zhonglin Wang

Beijing Institute of Nanoenergy and Nanosystems

Z

Zhi Li

J

Juntao Zhou

School of Materials and Microelectronics & Center of Smart Materials and Devices, State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology , Wuhan 430070,

X

Xin Zhen

X

Xin Zhang