Polarization-controlled contact barriers enable giant tunneling electroresistance in van der Waals ferroelectric tunnel junctions

X Xueyan Bai D Daifeng Zou (School of Physics and Electronic Science, Hunan University of Science and Technology 1 , Xiangtan 411201,) C Chihou Lei (Department of Physics and Engineering, University of Scranton 3 , Scranton, Pennsylvania 18510,) Z Zhijian He Y Yunya Liu (Key Laboratory of Low Dimensional Materials and Application Technology, Ministry of Education School of Materials Science and Engineering Xiangtan University Xiangtan China)

Abstract

The regulation of tunneling electroresistance (TER) in two-dimensional (2D) ferroelectric tunnel junctions (FTJs) is crucial for their practical applications. In this Letter, we introduce an innovative approach to manipulate TER by altering the interfacial contact barrier through polarization-induced modifications in interface transport properties. A comprehensive analysis of the electronic structures within heterostructures, consisting of a metallic TaSe2 monolayer and a ferroelectric Sc2CO2 layer, uncovers a dual modulation effect of ferroelectricity on both the Schottky barrier height and the interfacial tunneling barrier. This phenomenon substantiates the influence of polarization on charge carrier transport across the interface. Through calculations employing the non-equilibrium Green's function method, we reveal a significant TER ratio (2.41×1013%) in TaSe2/Sc2CO2-based FTJs. Our findings illustrate that distinct tunneling resistance states can be achieved through polarization reversal, as predicted by the proposed mechanism. These insights enhance the understanding of polarization-mediated TER in 2D FTJs and provide a foundation for the design of next-generation electronic devices leveraging 2D ferroelectric materials.

Article Details

Volume / Issue Vol. 126, Issue 16
Published April 21, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (5)

X

Xueyan Bai

D

Daifeng Zou

School of Physics and Electronic Science, Hunan University of Science and Technology 1 , Xiangtan 411201,

C

Chihou Lei

Department of Physics and Engineering, University of Scranton 3 , Scranton, Pennsylvania 18510,

Z

Zhijian He

Y

Yunya Liu

Key Laboratory of Low Dimensional Materials and Application Technology, Ministry of Education School of Materials Science and Engineering Xiangtan University Xiangtan China