Performance enhancement in NbO2/HfO2 bilayer threshold switching memristor as an oscillatory neuron

Y Yaoyao JIN Z Zihao Zhang (Shanghai Engineering Research Center of Tooth Restoration and Regeneration and Tongji Research Institute of Stomatology and Department of Implantology, Shanghai Tongji Stomatological Hospital and Dental School, Tongji University) S Shanwu Ke (Key Laboratory of Intelligent Sensing System and Security of the Ministry of Education, Hubei University 2 , Wuhan 430062,) Y Yifan Zhao C Canhui Liu (Key Laboratory of Intelligent Sensing System and Security of the Ministry of Education, Hubei University 2 , Wuhan 430062,) G Guangyu Liu C Cong Ye

Abstract

NbO2-based threshold switching (TS) devices show great potential for artificial neurons in neuromorphic computing. Here, by inserting an HfO2 layer with a thickness of 10 nm, an NbO2/HfO2 bilayer memristor achieved excellent volatile performance with a low threshold voltage (Vth) of 1 V, a small Vth/Vh coefficient of variation, and high selectivity over 102. From the temperature dependence I–V curves of NbO2/HfO2 memristors, it is observed that Vth decreases and OFF current (IOFF) increases with the increase in the test temperature, which agrees well with the behavior of the NbO2 TS memristor originating from the Mott transition mechanism. Furthermore, a leaky integrate-and-fire (LIF) neuron circuit containing an NbO2/HfO2 memristor is built to simulate biological neuron characteristics, and the oscillation frequencies for the neuron can achieve a high value over 4 MHz, which belongs to the fastest ones among TS devices and shows that the design of the Ti/NbO2/HfO2/Pt memristor is feasible for enhancing the response speed and information processing capability for application in neuromorphic computing as the main component of an artificial neuron system.

Article Details

Volume / Issue Vol. 127, Issue 11
Published September 15, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

Y

Yaoyao JIN

Z

Zihao Zhang

Shanghai Engineering Research Center of Tooth Restoration and Regeneration and Tongji Research Institute of Stomatology and Department of Implantology, Shanghai Tongji Stomatological Hospital and Dental School, Tongji University

S

Shanwu Ke

Key Laboratory of Intelligent Sensing System and Security of the Ministry of Education, Hubei University 2 , Wuhan 430062,

Y

Yifan Zhao

C

Canhui Liu

Key Laboratory of Intelligent Sensing System and Security of the Ministry of Education, Hubei University 2 , Wuhan 430062,

G

Guangyu Liu

C

Cong Ye