Patch antenna enhanced charge-sensitive infrared phototransistors

M Mohsen Bahrehmand (Laboratoire de Physique de l'École Normale Supérieure ENS, Université PSL, CNRS, Sorbonne Université, Université de Paris 1 , F-75005 Paris,) F Francesco Pisani (Laboratoire de Physique et d'′ Etude des Matériaux, LPEM, UMR 8213, ESPCI Paris, Université, PSL, CNRS, Sorbonne Université 2 , F-75005 Paris,) B Baptiste Fix (DOTA, ONERA, Université Paris-Saclay 3 , 91120 Palaiseau,) D Djamal Gacemi (Laboratoire de Physique de l'École Normale Supérieure ENS, Université PSL, CNRS, Sorbonne Université, Université de Paris 1 , F-75005 Paris,) W Wenjian Wan Z Zhenzhen Zhang H Hua Li Y Yanko Todorov (Laboratoire de Physique et d'′ Etude des Matériaux, LPEM, UMR 8213, ESPCI Paris, Université, PSL, CNRS, Sorbonne Université 2 , F-75005 Paris,)

Abstract

Charge-sensitive infrared phototransistors (CSIP) constitute an outstanding technology for mid-infrared detection with sensitivities demonstrated at the single photon level. Here, we report on the performances of CSIP detectors operating at a wavelength λ = 8.9 μm that are integrated into double-metal patch antenna resonators. In order to build such devices, we have developed a fabrication protocol that allows accommodating the phototransistor architecture with the double-metal geometry providing very strong electromagnetic field confinement. We observe minimal photon fluxes in the order of 7000 photons/s.μm2 that are 103 smaller with respect to previous realizations of devices with similar absorbing regions in a mesa geometry. This work opens additional perspectives for building ultra-small area devices, as required for single photon counters, while keeping high quantum absorption efficiencies.

Article Details

Volume / Issue Vol. 127, Issue 1
Published July 07, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (8)

M

Mohsen Bahrehmand

Laboratoire de Physique de l'École Normale Supérieure ENS, Université PSL, CNRS, Sorbonne Université, Université de Paris 1 , F-75005 Paris,

F

Francesco Pisani

Laboratoire de Physique et d'′ Etude des Matériaux, LPEM, UMR 8213, ESPCI Paris, Université, PSL, CNRS, Sorbonne Université 2 , F-75005 Paris,

B

Baptiste Fix

DOTA, ONERA, Université Paris-Saclay 3 , 91120 Palaiseau,

D

Djamal Gacemi

Laboratoire de Physique de l'École Normale Supérieure ENS, Université PSL, CNRS, Sorbonne Université, Université de Paris 1 , F-75005 Paris,

W

Wenjian Wan

Z

Zhenzhen Zhang

H

Hua Li

Y

Yanko Todorov

Laboratoire de Physique et d'′ Etude des Matériaux, LPEM, UMR 8213, ESPCI Paris, Université, PSL, CNRS, Sorbonne Université 2 , F-75005 Paris,