Passivation of antimony vacancies by Al3+ ions and anode interface modification for enhancing the efficiency of Sb2Se3 thin-film solar cells

Y Yi Xiang X Xin-Yi Dong (Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,) H Hao-Jie Ma (Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,) M Meng Xu C Chuan-Hui Cheng (Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,) Y Yanhan Ren (Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,) J Junfeng Gao (Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Ministry of Education, Dalian University of Technology, Dalian, China.) J Jing Leng W Wenming Tian (State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, 457 Zhong Shan Road, Dalian 116023, P. R. China) R Rongrong Cui S Shengye Jin (State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics) Z Zhiguang Sun (Instrumental Analysis Center, Dalian University of Technology 4 , Dalian 116024,) J Jingyi Xiao T Tianming Lv (Instrumental Analysis Center, Dalian University of Technology 4 , Dalian 116024,) Y Yong-Chang Han (Department of Physics, Dalian University of Technology 3 , Dalian 116024,)

Abstract

Vacancies of Se and Sb are the most detrimental deep-level defects in the Sb2Se3 film. Herein, an approach is proposed to passivate the Sb vacancies using Al3+ ions. The tris(8-hydroxy-quinolinato) aluminum (Alq3) is employed as the Al3+ source, which is buried between indium tin oxide (ITO) and Sb2Se3. Additionally, the incorporation of the Alq3 layer not only inhibits the chemical reaction between Sb2Se3 and ITO but also lowers the contact barrier. As a result, the open-circuit voltage increases from 0.34 to 0.43 V, and the power conversion efficiency rises from 3.3% to 5.1%. Notably, our finding confirms that the grain boundary in the Sb2Se3 film with (020) preferred orientation is harmless and does not induce significant carrier recombination. The device is fabricated by conventional vacuum thermal evaporation. This study offers insights into enhancing the efficiency of Sb2Se3 solar cells.

Article Details

Volume / Issue Vol. 126, Issue 25
Published June 23, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (15)

Y

Yi Xiang

X

Xin-Yi Dong

Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,

H

Hao-Jie Ma

Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,

M

Meng Xu

C

Chuan-Hui Cheng

Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,

Y

Yanhan Ren

Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education 1 , Dalian 116024,

J

Junfeng Gao

Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Ministry of Education, Dalian University of Technology, Dalian, China.

J

Jing Leng

W

Wenming Tian

State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, 457 Zhong Shan Road, Dalian 116023, P. R. China

R

Rongrong Cui

S

Shengye Jin

State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics

Z

Zhiguang Sun

Instrumental Analysis Center, Dalian University of Technology 4 , Dalian 116024,

J

Jingyi Xiao

T

Tianming Lv

Instrumental Analysis Center, Dalian University of Technology 4 , Dalian 116024,

Y

Yong-Chang Han

Department of Physics, Dalian University of Technology 3 , Dalian 116024,