Overlap-scanning self-referencing diffractive imaging with enlarged field of view under incoherent illumination
Abstract
Coherent diffractive imaging (CDI), especially the ptychography, has been widely used in quantitative phase imaging. However, in traditional diffractive imaging schemes, a highly coherent light source is required for a better-posed inverse problem. Considering that the high coherence cannot be guaranteed in all cases and to avoid the multi-mode of low-coherence light sources complicating the iterative modeling of diffractive imaging, we proposed an overlap-scanning self-referencing diffractive imaging. As a non-iterative partially coherent diffractive imaging method, self-referencing diffractive imaging was combined with the procedure of overlap-scanning ptychography. It does not require prior knowledge of light source coherence, and only a coherent inverse problem was needed to be solved in the final stitching. It has been demonstrated to be able to recover the complex amplitude of objects illuminated by various low-coherence light sources. This study presents significant potential for applications in phase imaging with a wide-field of view under incoherent illuminations.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (7)
Hairui Sun
School of Physical Science and Technology, Jiangsu Key Laboratory of Frontier Material Physics and Devices & Suzhou Key Laboratory of Intelligent Photoelectric Perception, Soochow University 1 , Suzhou 215006,
Zhuoyi Wang
Yiqin Ouyang
Tongji University School of Medicine, Shanghai East Hospital, Department of Gynaecology and Obstetrics 2 , Shanghai 200241,
Hao Zhang
Xingyuan Lu
Yangjian Cai
Chengliang Zhao
School of Physical Science and Technology, Jiangsu Key Laboratory of Frontier Material Physics and Devices & Suzhou Key Laboratory of Intelligent Photoelectric Perception, Soochow University 1 , Suzhou 215006,