Optical identification and anti-counterfeiting based on plasmonic core–shell nanoparticles with Fano resonance

N Nga Vu (Department of Electrical and Computer Engineering, University of Illinois at Chicago 1 , Chicago, Illinois 60607,) M Mohamed Farhat C Chien-Hao Liu (Department of Mechanical Engineering, National Taiwan University 3 , Taipei 10617,) P Pai-Yen Chen (Department of Electrical and Computer Engineering, University of Illinois at Chicago 1 , Chicago, Illinois 60607,)

Abstract

Fano resonance with an asymmetric and ultrasharp resonant line shape has been extensively studied in various light scattering scenes, unlocking several applications for sensing, information processing, and optical identification. Fano resonance appearing in multilayered nanoparticles (NPs) is particularly intriguing as its sharp and comb-like resonant line shape may enable optical identification at the nanoscale. We herein propose the concept of the optical physical unclonable function (PUF) based on the scattering responses of core–shell (plasmonic-dielectric) NPs. Specifically, the sharp, asymmetric spectral responses near the Fano resonance frequency, which are highly sensitive to perturbations (e.g., nanomanufacturing imperfections), can be exploited as a unique electromagnetic fingerprint for PUF-based identification and anti-counterfeiting applications. Here, we theoretically and statistically demonstrate that scattering from Fano-resonant multilayered NPs can be regarded as a perfect entropy source for the generation of PUF encryption keys, with outstanding performance in terms of uniqueness, randomness, encoding capacity, and NIST randomness test results. The proposed optical PUF opens pathways to implement nano-tags for optical identification, authentication, and anti-counterfeiting applications.

Article Details

Volume / Issue Vol. 126, Issue 19
Published May 12, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (4)

N

Nga Vu

Department of Electrical and Computer Engineering, University of Illinois at Chicago 1 , Chicago, Illinois 60607,

M

Mohamed Farhat

C

Chien-Hao Liu

Department of Mechanical Engineering, National Taiwan University 3 , Taipei 10617,

P

Pai-Yen Chen

Department of Electrical and Computer Engineering, University of Illinois at Chicago 1 , Chicago, Illinois 60607,