Non-pinched hysteresis in CrO <i>x</i> /TiO <i>y</i> -based memristive devices: Modeling and analysis

P Phu-Quan Pham (Faculty of Materials Science and Technology, University of Science, Vietnam National University-Ho Chi Minh City 1 , Ho Chi Minh City 72754,) N Ngoc-Lam Pham Le (Semiconductor and Advanced Materials Institute, Technology and Innovation Park, Vietnam National University-Hanoi 3 , Hoa Lac, Hanoi 13151,) T Thuy-Anh Tran (Faculty of Materials Science and Technology, University of Science, Vietnam National University-Ho Chi Minh City 1 , Ho Chi Minh City 72754,) V Van-Son Dang (Faculty of Physics, University of Science, Vietnam National University-Hanoi 4 , 334 Nguyen Trai, Thanh Xuan, Hanoi 11406,) Q Quang Nguyen N Ngoc Kim Pham (Faculty of Materials Science and Technology, University of Science, Vietnam National University-Ho Chi Minh City 1 , Ho Chi Minh City 72754,) T Thuat Nguyen-Tran (Semiconductor and Advanced Materials Institute, Technology and Innovation Park, Vietnam National University-Hanoi 3 , Hoa Lac, Hanoi 13151,)

Abstract

Transition-metal oxide memristors are promising for neuromorphic computing, yet most SPICE models overlook material-specific effects such as oxygen stoichiometry and non-pinched hysteresis. Here, we systematically study CrOx/TiOy memristors fabricated under controlled oxygen concentrations (10%–50%) and propose an improved SPICE-compatible model. The devices exhibit oxygen-dependent resistive switching, retention, and pulse-driven plasticity, with optimal performance at 40% oxygen. Our model explicitly reproduces the non-pinched hysteresis observed in I–V curves, consistent with behaviors such as ion immigration, charge trapping, and remnant polarization, and achieves close agreement with experiments across multiple stoichiometries. Validation includes endurance, retention, and synaptic functions such as long-term potentiation/depression and spike-number/amplitude-dependent plasticity. Finally, the model is extended from single devices to a 4 × 4 crossbar array, demonstrating its scalability for artificial neural network simulations. These results emphasize the critical role of oxygen stoichiometry in CrOx/TiOy memristors and introduce a modeling framework that bridges experimental device physics with circuit-level neuromorphic applications.

Article Details

Volume / Issue Vol. 128, Issue 15
Published April 13, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

P

Phu-Quan Pham

Faculty of Materials Science and Technology, University of Science, Vietnam National University-Ho Chi Minh City 1 , Ho Chi Minh City 72754,

N

Ngoc-Lam Pham Le

Semiconductor and Advanced Materials Institute, Technology and Innovation Park, Vietnam National University-Hanoi 3 , Hoa Lac, Hanoi 13151,

T

Thuy-Anh Tran

Faculty of Materials Science and Technology, University of Science, Vietnam National University-Ho Chi Minh City 1 , Ho Chi Minh City 72754,

V

Van-Son Dang

Faculty of Physics, University of Science, Vietnam National University-Hanoi 4 , 334 Nguyen Trai, Thanh Xuan, Hanoi 11406,

Q

Quang Nguyen

N

Ngoc Kim Pham

Faculty of Materials Science and Technology, University of Science, Vietnam National University-Ho Chi Minh City 1 , Ho Chi Minh City 72754,

T

Thuat Nguyen-Tran

Semiconductor and Advanced Materials Institute, Technology and Innovation Park, Vietnam National University-Hanoi 3 , Hoa Lac, Hanoi 13151,