Modulation of charge transport and rectification behavior in CsSnI3 thin films through A-site cation engineering

A Anna A. Zarudnyaya (LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,) G Gleb V. Segal (LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,) A Andrey P. Morozov (LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,) L Lev O. Luchnikov (LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,) S Sergey Yu. Yurchuk (Department of Semiconductor Electronics and Device Physics, NUST MISIS 2 , 119049 Moscow,) A Alexey E. Aleksandrov (Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences 3 , Leninsky prosp., 31, bld.4, Moscow 119071,) I Ildar R. Sayarov (Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences 3 , Leninsky prosp., 31, bld.4, Moscow 119071,) A Alexey R. Tameev (Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences 3 , Leninsky prosp., 31, bld.4, Moscow 119071,) O Oleg Rabinovich (Department of Semiconductor Electronics and Device Physics, NUST MISIS 2 , 119049 Moscow,) I Ivan V. Schemerov (Department of Semiconductor Electronics and Device Physics, NUST MISIS 2 , 119049 Moscow,) P Pavel A. Gostishchev (LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,) D Danila S. Saranin (LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,)

Abstract

CsSnI3 perovskite is a thin-film semiconductor with high intrinsic conductivity for various device applications (thermoelectric, photovoltaics, etc.). Stoichiometric CsSnI3 has high-density defects and structural imperfections affecting device performance. In this work, we made an investigation on A-site cation engineering to evaluate the correlation between structural and transport parameters for effective operation in rectifying devices. Here, we analyzed CsSnI3 thin films modified with methylamine (MA), formamidine (FA), guanidine (GuA), and 5-ammonium valeric acid (AVA) cations, correlating structural parameters obtained by Rietveld refinement with their optoelectronic and diode characteristics. MA-, FA-, and GuA-substituted films exhibited low sheet resistance (∼450–2200 Ω/sq); however, strain-induced lattice distortions and accumulated defects in GuA-substituted films significantly hindered effective charge collection and increased recombination losses. AVA substitution formed low-conductivity 2D interlayers, increasing resistance (>105 Ω/sq) and altering transient response characteristics, yet provided minimal reverse switching losses (∼100 μW/cm2), beneficial for high-frequency applications. FA substitution emerged as optimal, balancing structural stability, conductivity, minimal defects, and relevant diode properties. The obtained results highlight that targeted lattice modifications strongly influence the practical performance of rectifying p–i–n diodes based on CsSnI3.

Article Details

Volume / Issue Vol. 126, Issue 26
Published June 30, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (12)

A

Anna A. Zarudnyaya

LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,

G

Gleb V. Segal

LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,

A

Andrey P. Morozov

LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,

L

Lev O. Luchnikov

LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,

S

Sergey Yu. Yurchuk

Department of Semiconductor Electronics and Device Physics, NUST MISIS 2 , 119049 Moscow,

A

Alexey E. Aleksandrov

Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences 3 , Leninsky prosp., 31, bld.4, Moscow 119071,

I

Ildar R. Sayarov

Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences 3 , Leninsky prosp., 31, bld.4, Moscow 119071,

A

Alexey R. Tameev

Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences 3 , Leninsky prosp., 31, bld.4, Moscow 119071,

O

Oleg Rabinovich

Department of Semiconductor Electronics and Device Physics, NUST MISIS 2 , 119049 Moscow,

I

Ivan V. Schemerov

Department of Semiconductor Electronics and Device Physics, NUST MISIS 2 , 119049 Moscow,

P

Pavel A. Gostishchev

LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,

D

Danila S. Saranin

LASE—Laboratory of Advanced Solar Energy, NUST MISIS 1 , 119049 Moscow,