MOCVD AlYN/GaN HEMTs with 66.5 mV/decade sub-threshold swing and 109 on/off ratio

K Kazuki Nomoto (School of Electrical and Computer Engineering, Cornell University 3 , Ithaca, New York 14850,) I Isabel Streicher (Fraunhofer Institute for Applied Solid State Physics IAF 2 , Tullastrasse 72, 79108 Freiburg,) T Thai-Son Nguyen (Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,) C Chandrashekhar Savant (Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,) M Madhav Ramesh (School of Electrical and Computer Engineering, Cornell University 1 , Ithaca, New York 14853,) S Siyuan Ma (Department of Chemistry and the MOE Key Lab of Spectrochemical Analysis & Instrumentation, College of Chemistry and Chemical Engineering) J Jimy Encomendero (School of Electrical and Computer Engineering, Cornell University 4 , Ithaca, New York 14853,) L Lutz Kirste (Fraunhofer Institute for Applied Solid State Physics IAF , 79108 Freiburg,) P Patrik Straňák (Fraunhofer Institute for Applied Solid State Physics IAF , 79108 Freiburg,) R Ruediger Quay (Fraunhofer Institute for Applied Solid State Physics IAF 2 , Tullastrasse 72, 79108 Freiburg,) S Stefano Leone (Fraunhofer Institute for Applied Solid State Physics IAF , 79108 Freiburg,) H Huili Grace Xing (Institute of Materials and Systems for Sustainability, Nagoya University 1 , Nagoya 464-8601,) D Debdeep Jena (School of Electrical and Computer Engineering, Cornell University 2 , Ithaca, New York 14853,)

Abstract

We report the realization and operation of AlYN/GaN high-electron-mobility transistors (HEMTs). Metal-organic chemical vapor deposition is used to deposit AlYN/GaN semiconductor heterostructures on 100 mm SiC substrates. Polarization-induced 2D electron gas channels formed in the heterostructure exhibit room-temperature mobility >1300 cm2/V s, sheet density >1.4×1013/cm2, and sheet resistance <350 Ω/□ with good uniformity. Micron-long gate length HEMTs fabricated using regrown n+ GaN contacts demonstrate good DC performance with saturation drain current >0.4 A/mm, transconductance >0.3 S/mm, low threshold voltage VT=−2.0 V, and a high on/off ratio surpassing 109. The drain current shows a nearly negligible hysteresis with the sweep of the gate voltage. Notably, the devices exhibit a near-Boltzmann limit sub-threshold swing of 66.5 mV/dec. These observations highlight the promise of AlYN/GaN HEMTs for high-performance electronic applications.

Article Details

Volume / Issue Vol. 126, Issue 22
Published June 02, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (13)

K

Kazuki Nomoto

School of Electrical and Computer Engineering, Cornell University 3 , Ithaca, New York 14850,

I

Isabel Streicher

Fraunhofer Institute for Applied Solid State Physics IAF 2 , Tullastrasse 72, 79108 Freiburg,

T

Thai-Son Nguyen

Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,

C

Chandrashekhar Savant

Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,

M

Madhav Ramesh

School of Electrical and Computer Engineering, Cornell University 1 , Ithaca, New York 14853,

S

Siyuan Ma

Department of Chemistry and the MOE Key Lab of Spectrochemical Analysis & Instrumentation, College of Chemistry and Chemical Engineering

J

Jimy Encomendero

School of Electrical and Computer Engineering, Cornell University 4 , Ithaca, New York 14853,

L

Lutz Kirste

Fraunhofer Institute for Applied Solid State Physics IAF , 79108 Freiburg,

P

Patrik Straňák

Fraunhofer Institute for Applied Solid State Physics IAF , 79108 Freiburg,

R

Ruediger Quay

Fraunhofer Institute for Applied Solid State Physics IAF 2 , Tullastrasse 72, 79108 Freiburg,

S

Stefano Leone

Fraunhofer Institute for Applied Solid State Physics IAF , 79108 Freiburg,

H

Huili Grace Xing

Institute of Materials and Systems for Sustainability, Nagoya University 1 , Nagoya 464-8601,

D

Debdeep Jena

School of Electrical and Computer Engineering, Cornell University 2 , Ithaca, New York 14853,