Microwave-regime demonstration of plasmonic non-reciprocity in a flowing two-dimensional electron gas

J Jingyee Chee (John A. Paulson School of Engineering and Applied Sciences, Harvard University 1 , Cambridge, Massachusetts 02138,) H Han Sae Jung (John A. Paulson School of Engineering and Applied Sciences, Harvard University 1 , Cambridge, Massachusetts 02138,) S Shannon Harvey (Department of Physics, Harvard University 2 , Cambridge, Massachusetts 02138,) K Kenneth West (Department of Electrical and Computer Engineering, Princeton University 3 , Princeton, New Jersey 08544,) L Loren Pfeiffer A Amir Yacoby D Donhee Ham (John A. Paulson School of Engineering and Applied Sciences, Harvard University 1 , Cambridge, Massachusetts 02138,)

Abstract

The speed of a plasmonic wave in the presence of electron drift in a conductor depends on the wave's propagation direction, with the wave traveling along the drift (“forward wave”) faster than the wave traveling against the drift (“backward wave”). Phenomena related to this plasmonic non-reciprocity—which is relatively more pronounced in two-dimensional conductors than in bulk conductors and could lead to solid-state device applications—have been studied in THz and optical spectral regimes. Here, we demonstrate the plasmonic non-reciprocity at microwave frequencies (10–50 GHz). Concretely, we conduct, at 4 K, a microwave network analysis on a gated GaAs two-dimensional electron gas with electron drift (i.e., DC), directly measuring the forward and backward wave speeds via their propagation phase delays. We resolve, for example, forward and backward wave speeds of 4.26×10−3±8.97×10−6 (normalized to the speed of light). Sufficient consistency between the electron drift speed obtained from the microwave measurement and that alternatively estimated by a DC transport theory further confirms the non-reciprocity. We conclude this paper with a discussion on how to enhance the non-reciprocity for real-world applications, where degeneracy pressure would play an important role.

Article Details

Volume / Issue Vol. 127, Issue 4
Published July 28, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

J

Jingyee Chee

John A. Paulson School of Engineering and Applied Sciences, Harvard University 1 , Cambridge, Massachusetts 02138,

H

Han Sae Jung

John A. Paulson School of Engineering and Applied Sciences, Harvard University 1 , Cambridge, Massachusetts 02138,

S

Shannon Harvey

Department of Physics, Harvard University 2 , Cambridge, Massachusetts 02138,

K

Kenneth West

Department of Electrical and Computer Engineering, Princeton University 3 , Princeton, New Jersey 08544,

L

Loren Pfeiffer

A

Amir Yacoby

D

Donhee Ham

John A. Paulson School of Engineering and Applied Sciences, Harvard University 1 , Cambridge, Massachusetts 02138,