Mechanism of the negative linear temperature coefficient of resistance in defective nanocarbon materials

T Takahiro Morimoto (Department of Applied Physics) T Takumi Inaba (Semiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology (AIST) 2 , Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568,) S Satoshi Yamazaki (Laboratory for Stem Cell Therapy, Faculty of Medicine, Tsukuba University) K Kazufumi Kobashi (Nano Carbon Material Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) 1 , Tsukuba Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565,) T Toshiya Okazaki

Abstract

This paper presents the evidential results of the negative linear temperature coefficient mechanism commonly observed in defect-containing nanocarbon materials. Single-walled carbon nanotubes (CNTs) were annealed at high temperatures ranging from 1200 to 3000 °C. These samples exhibited a general hopping conduction-like behavior between the CNTs in the pristine state. However, the high-temperature annealed samples exhibited a resistance change with a negative temperature coefficient. Recently, we proposed that the origin of this negative linear temperature dependence of resistance behavior is a scattering phenomenon due to Friedel oscillations occurring in a flat graphene sheet containing defects. In fact, from the cross-sectional high-resolution transmission electron microscopy images, we found that the tube structure of the CNTs collapsed and fused with each other in the high-temperature annealed samples, revealing a stacked, flat graphite structure. These results show that the Friedel scattering phenomenon originates from the negative linear temperature coefficient widely observed in defect-containing nanocarbon materials. This negative linear temperature coefficient provides important information on the application of nanocarbon materials to thermistors, which have recently attracted significant attention, and on the optimal design guidelines for such thermistors. Moreover, the nonzero current and nondivergent resistance behavior based on the Friedel scattering phenomenon provide more stable measurement conditions for the quantum research field, including quantum computing, cryptography, and communications.

Article Details

Volume / Issue Vol. 126, Issue 17
Published April 28, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (5)

T

Takahiro Morimoto

Department of Applied Physics

T

Takumi Inaba

Semiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology (AIST) 2 , Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568,

S

Satoshi Yamazaki

Laboratory for Stem Cell Therapy, Faculty of Medicine, Tsukuba University

K

Kazufumi Kobashi

Nano Carbon Material Research Institute, National Institute of Advanced Industrial Science and Technology (AIST) 1 , Tsukuba Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565,

T

Toshiya Okazaki