Low turn-on and surge-robust <i>β</i> -Ga2O3 heterojunction barrier Schottky diodes enabled by conductivity modulation

S Shengliang Cheng (State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 1 , Guangzhou 510275,) Y Yuru Lai (State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 1 , Guangzhou 510275,) X Xing Lu H Huichao Hu (State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 3 , Guangzhou 510275,) R Rui Zhou R Rui Xie (School of Economics and Trade) H HaoWen Luo H Huaxing Jiang (School of Integrated Circuits, South China University of Technology 1 , Guangzhou,) Z Zhisheng Wu (Department of Electrical and Electronic Engineering) J Jun Liang Z Zimin Chen (Department of Emergency Medicine, State Key Laboratory of Biotherapy, West China Hospital, Sichuan University) G Gang Wang Y Yanli Pei (State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 1 , Guangzhou 510275,)

Abstract

We report β-Ga2O3 heterojunction barrier Schottky (HJBS) diodes featuring a low turn-on voltage (Von) and high surge robustness. A p-type NiO overlayer, fully covering the tungsten-based Schottky contacts, enables efficient minority carrier injection, thereby lowering Von and enhancing surge performance. Fabricated small-area diodes (0.15 × 0.12 mm2) exhibit a breakdown voltage of 1.4 kV and a Von of 0.51 V. Packaged large-area devices (3 × 3 mm2) deliver 6 A at a 2 V forward bias and sustain surge currents up to 50 A, attributed to conductivity modulation by the p-NiO overlayer. Technology computer-aided design (TCAD) simulations confirm that the proposed HJBS structure significantly reduces peak lattice temperatures compared to conventional designs. These results demonstrate the strong potential of β-Ga2O3 HJBS diodes for high-efficiency, low-loss power switching applications with enhanced transient tolerance.

Article Details

Volume / Issue Vol. 128, Issue 4
Published January 26, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (13)

S

Shengliang Cheng

State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 1 , Guangzhou 510275,

Y

Yuru Lai

State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 1 , Guangzhou 510275,

X

Xing Lu

H

Huichao Hu

State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 3 , Guangzhou 510275,

R

Rui Zhou

R

Rui Xie

School of Economics and Trade

H

HaoWen Luo

H

Huaxing Jiang

School of Integrated Circuits, South China University of Technology 1 , Guangzhou,

Z

Zhisheng Wu

Department of Electrical and Electronic Engineering

J

Jun Liang

Z

Zimin Chen

Department of Emergency Medicine, State Key Laboratory of Biotherapy, West China Hospital, Sichuan University

G

Gang Wang

Y

Yanli Pei

State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University 1 , Guangzhou 510275,