Low-temperature annealing stabilizes Sn2+ in tin–lead perovskites via crystallization kinetics for robust near-infrared photodetectors
Abstract
The photo-oxidation stability of tin–lead hybrid perovskites (TLHPs), arising from the facile Sn2+ oxidation and subsequent phase reconstruction, remains a major obstacle for near-infrared photodetectors (NIR PDs). Here, we demonstrate that low-temperature annealing provides an intrinsic and additive-free route to stabilize TLHPs by regulating crystallization kinetics. This process slows the crystallization of Sn-rich species relative to their Pb-rich counterparts, suppressing Sn accumulation at the bottom interface and forming a Sn-deficient barrier that inhibits initial Sn2+ oxidation. As a result, phase reconstruction and defect formation are effectively suppressed. The optimized PDs deliver a high responsivity of 0.40 A W−1, a specific detectivity of 2.64 × 1012 Jones at 810 nm, and an ultrafast response of 0.40/2.12 μs. Robust operation is further demonstrated in practical NIR applications, including photoplethysmography-based heart-rate monitoring and optical communication at 200 kHz. This work establishes crystallization-kinetics control as a scalable strategy for Sn2+ management, enabling stable and high-performance TLHP optoelectronics.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (13)
Li Sheng
Hefei Metrology and Testing Center
Chunyan Lu
Ran Zhao
Chemical Engineering Experiment Teaching Center, School of Chemical Engineering
Shareen Shafique
Department of Microelectronic Science and Engineering, School of Physical Science and Technology, Ningbo University 1 , Ningbo 315211,
Zhenwang Luo
Department of Microelectronic Science and Engineering, School of Physical Science and Technology, Ningbo University 1 , Ningbo 315211,
Pengxi Wang
Biao Yang
State Key Laboratory of Fine Chemicals, Frontiers Science Center for Smart Materials Oriented Chemical Engineering, School of Chemical Engineering
Haitao Zeng
Department of Microelectronic Science and Engineering, School of Physical Science and Technology, Ningbo University 1 , Ningbo 315211,
Cheng Yang
Institute of Materials Research
Xu Wang
Zhenfu Zhao
Department of Microelectronic Science and Engineering, School of Physical Science and Technology, Ningbo University 1 , Ningbo 315211,
Fei Zheng
Ziyang Hu
Department of Chemistry, The University of Hong Kong 1 , Pokfulam Road, Hong Kong,