Low loss 4H-SiC photonics for spin-quantum sensing

P P. A. Stuermer (Infineon Technologies Austria AG 1 , Villach,) T T. Steidl (3rd Institute of Physics 2 , Stuttgart,) R R. Woernle (3rd Institute of Physics 2 , Stuttgart,) W W. Schustereder (Infineon Technologies Austria AG 1 , Villach,) C C. Zmoelnig (Infineon Technologies Austria AG 1 , Villach,) J J. Riss (Infineon Technologies Austria AG 1 , Villach,) H H. Schoenherr (Infineon Technologies Austria AG 1 , Villach,) P P. Urlesberger (Infineon Technologies Austria AG 1 , Villach,) K K. Edelmann (Institut für Mikroelektronik Stuttgart (IMS CHIPS) 3 , Stuttgart,) M M. Kaschel (Institut für Mikroelektronik Stuttgart (IMS CHIPS) 3 , Stuttgart,) M M. Kern (Institute of Smart Sensors 4 , Stuttgart,) J J. Anders (Institute of Smart Sensors 4 , Stuttgart,) S S. Krainer (Infineon Technologies Austria AG 1 , Villach,) H H. Heiss (Infineon AG 5 , Munich,) J J. Wrachtrup (3rd Institute of Physics 2 , Stuttgart,)

Abstract

This work presents a comprehensive study on the development of planar integrated photonics for 4H silicon carbide (SiC) quantum sensors, with a focus on achieving high-performance and scalable devices. By leveraging high-volume SiC technology, we achieve a substantial reduction in optical losses, reaching 3.5 dB/cm at 785 nm, thereby surpassing the performance of previously reported planar SiC waveguides. A comprehensive analysis of the signal mode profile yields valuable insights into the modal characteristics of the waveguides, enabling the optimization of N-doping profiles for the optimal incorporation of V2 silicon vacancy color centers, which possess unique optical and spin properties essential for quantum sensing applications. Notably, our platform demonstrates broadband capability, supporting the development of both multi-mode and single-mode waveguides. Furthermore, we minimize surface roughness of the coupling facets to an root mean square value of 0.2 nm, thereby reducing scattering losses and enhancing device performance while maintaining compatibility with high-volume manufacturing processes. V2 color centers are created within the waveguide through proton implantation, as evidenced by the detection of fluorescence light above 850 nm within the guided waveguide mode, highlighting the potential of our platform for highly sensitive and compact SiC-based quantum sensors.

Article Details

Volume / Issue Vol. 127, Issue 10
Published September 08, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (15)

P

P. A. Stuermer

Infineon Technologies Austria AG 1 , Villach,

T

T. Steidl

3rd Institute of Physics 2 , Stuttgart,

R

R. Woernle

3rd Institute of Physics 2 , Stuttgart,

W

W. Schustereder

Infineon Technologies Austria AG 1 , Villach,

C

C. Zmoelnig

Infineon Technologies Austria AG 1 , Villach,

J

J. Riss

Infineon Technologies Austria AG 1 , Villach,

H

H. Schoenherr

Infineon Technologies Austria AG 1 , Villach,

P

P. Urlesberger

Infineon Technologies Austria AG 1 , Villach,

K

K. Edelmann

Institut für Mikroelektronik Stuttgart (IMS CHIPS) 3 , Stuttgart,

M

M. Kaschel

Institut für Mikroelektronik Stuttgart (IMS CHIPS) 3 , Stuttgart,

M

M. Kern

Institute of Smart Sensors 4 , Stuttgart,

J

J. Anders

Institute of Smart Sensors 4 , Stuttgart,

S

S. Krainer

Infineon Technologies Austria AG 1 , Villach,

H

H. Heiss

Infineon AG 5 , Munich,

J

J. Wrachtrup

3rd Institute of Physics 2 , Stuttgart,