Large positive VFB shift achieved by a band alignment modulated with insertion of Ga2O3 dipole layer

X Xiao-na Zhu L Lei Shen (Key Laboratory of Functional Polymer Materials of Ministry of Education; Tianjin Key Laboratory of Functional Polymer Materials; Institute of Polymer Chemistry, College of Chemistry) Y Yu-Chun Li Y Yu-Dong Lv (State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University 1 , Shanghai 200433,) C Cai-Yu Shi (School of Microelectronics, College of Integrated Circuits and Micro-Nano Electronics, Fudan University 1 , Shanghai 200433, ; , Shanghai 201203, ; , Jiaxing, Zhejiang Province 314100,) T Teng Huang (Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences) Z Zi-Ying Huang (School of Microelectronics, College of Integrated Circuits and Micro-Nano Electronics, Fudan University 1 , Shanghai 200433, ; , Shanghai 201203, ; , Jiaxing, Zhejiang Province 314100,) D David Wei Zhang H Hong-Liang Lu (School of Microelectronics, College of Integrated Circuits and Micro-Nano Electronics, Fudan University 1 , Shanghai 200433, ; , Shanghai 201203, ; , Jiaxing, Zhejiang Province 314100,)

Abstract

In this Letter, a Ga2O3 dipole layer deposited at the SiO2/HfO2 interface by in situ atomic layer deposition (ALD) has been demonstrated to be a great positive dipole. Through the in situ ALD of 10–30 cycles Ga2O3 dipole layer, a 1.09–1.59 V flatband voltage positive modulation range is obtained with a small 0.05–0.36 nm equivalent oxide thickness penalty, respectively. The modification of the band alignment is verified by x-ray photoelectron spectroscopy measurement on the gate stacks before and after Ga2O3 dipole layer insertion. The valence band offset between SiO2/HfO2 has been suppressed by the insertion of Ga2O3, proving a p-type dipole nature of Ga2O3 dipole layer. The first interface of SiO2/Ga2O3 more dominantly decides the p-type nature, and the second Ga2O3/HfO2 suppresses it. This work indicates that ALD of Ga2O3 is a promising positive dipole candidate for multiple threshold voltage technology in advanced process nodes.

Article Details

Volume / Issue Vol. 126, Issue 8
Published February 24, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (9)

X

Xiao-na Zhu

L

Lei Shen

Key Laboratory of Functional Polymer Materials of Ministry of Education; Tianjin Key Laboratory of Functional Polymer Materials; Institute of Polymer Chemistry, College of Chemistry

Y

Yu-Chun Li

Y

Yu-Dong Lv

State Key Laboratory of ASIC and System, Shanghai Institute of Intelligent Electronics & Systems, School of Microelectronics, Fudan University 1 , Shanghai 200433,

C

Cai-Yu Shi

School of Microelectronics, College of Integrated Circuits and Micro-Nano Electronics, Fudan University 1 , Shanghai 200433, ; , Shanghai 201203, ; , Jiaxing, Zhejiang Province 314100,

T

Teng Huang

Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences

Z

Zi-Ying Huang

School of Microelectronics, College of Integrated Circuits and Micro-Nano Electronics, Fudan University 1 , Shanghai 200433, ; , Shanghai 201203, ; , Jiaxing, Zhejiang Province 314100,

D

David Wei Zhang

H

Hong-Liang Lu

School of Microelectronics, College of Integrated Circuits and Micro-Nano Electronics, Fudan University 1 , Shanghai 200433, ; , Shanghai 201203, ; , Jiaxing, Zhejiang Province 314100,