Investigation of thermoelectric transport properties of <i>c</i>-axis oriented SnSb2Te4 thin-film fabricated using pulsed laser deposition technology

M Mingjing Chen Y Yangyang Zhen (Hebei Key Laboratory of Energy Metering and Safety Testing Technology, National & Local Joint Engineering Research Center of Metrology Instrument and System, College of Quality and Technical Supervision, Hebei University 1 , Baoding 071002,) Z Zihao Chen (Department of Materials Science and Engineering) T Tianchang Qin (Hebei Key Laboratory of Energy Metering and Safety Testing Technology, National & Local Joint Engineering Research Center of Metrology Instrument and System, College of Quality and Technical Supervision, Hebei University 1 , Baoding 071002,) H Haixu Liu (Hebei Key Laboratory of Optic-Electronic Information and Materials, College of Physics Science and Technology, Hebei University 2 , Baoding 071002,) X Xin Qian S Shufang Wang

Abstract

The van der Waals layered compound SnSb2Te4 has attracted intense attention as a promising thermoelectric material, yet its thin-film thermoelectric performance remains unexplored. In this study, we report the growth and thermoelectric properties of c-axis oriented SnSb2Te4 thin films using pulsed laser deposition technology. Systematic transport measurements revealed the strong correlation between deposition temperature, carrier concentration, and thermoelectric properties. Notably, the film deposited at 275 °C exhibited well-ordered crystalline structures with controlled orientation and superior thermoelectric performance, achieving a remarkable power factor of 8.3 µW cm−1 K−2 and a corresponding zT value of 0.18 at 575 K, demonstrating the great potential application of SnSb2Te4 thin films for micro-thermoelectric devices.

Article Details

Volume / Issue Vol. 126, Issue 21
Published May 26, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

M

Mingjing Chen

Y

Yangyang Zhen

Hebei Key Laboratory of Energy Metering and Safety Testing Technology, National & Local Joint Engineering Research Center of Metrology Instrument and System, College of Quality and Technical Supervision, Hebei University 1 , Baoding 071002,

Z

Zihao Chen

Department of Materials Science and Engineering

T

Tianchang Qin

Hebei Key Laboratory of Energy Metering and Safety Testing Technology, National & Local Joint Engineering Research Center of Metrology Instrument and System, College of Quality and Technical Supervision, Hebei University 1 , Baoding 071002,

H

Haixu Liu

Hebei Key Laboratory of Optic-Electronic Information and Materials, College of Physics Science and Technology, Hebei University 2 , Baoding 071002,

X

Xin Qian

S

Shufang Wang