Intrinsic nanoscale ordering and strain–defect coupling in ferroelectric Al1 <b>−</b> xScxN

S Shaon Das (Department of Materials Design and Innovation) T Thai-Son Nguyen (Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,) C Chandrashekhar Savant (Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,) K Karthick Gothandapani (Department of Materials Design and Innovation, University at Buffalo 1 , Buffalo, New York 14260,) H Huili Grace Xing (Institute of Materials and Systems for Sustainability, Nagoya University 1 , Nagoya 464-8601,) D Debdeep Jena (School of Electrical and Computer Engineering, Cornell University 2 , Ithaca, New York 14853,) B Baishakhi Mazumder (Department of Materials Design and Innovation)

Abstract

Al1−xScxN (AlScN) has emerged as a promising ferroelectric material for next-generation memory and logic devices; yet its performance remains limited by poor understanding of nanoscale structural instabilities. Here, we uncover intrinsic short-range chemical ordering and strain–defect coupling in molecular-beam-epitaxy grown Al0.66Sc0.34N using a combination of atom probe tomography and transmission electron microscopy. The heterostructure exhibits wurtzite structure with a sharp and clean AlScN/AlN interface with negligible interdiffusion. Frequency distribution and radial distribution analyses reveal statistically significant Sc–Sc enrichment and Sc–N depletion, indicating nanoscale clustering accompanied by local nitrogen deficiency. Corresponding lattice-spacing variations observed by inverse FFT mapping confirm strain variation correlated with Sc-rich domains. These results provide the first atom-by-atom experimental evidence of scandium clustering and its coupling to nitrogen-vacancy formation in the ferroelectric composition regime. These findings identify short-range ordering and strain–defect coupling as intrinsic structural features of ferroelectric AlScN, with important implications for polarization switching behavior and reliability.

Article Details

Volume / Issue Vol. 128, Issue 14
Published April 06, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

S

Shaon Das

Department of Materials Design and Innovation

T

Thai-Son Nguyen

Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,

C

Chandrashekhar Savant

Department of Materials Science and Engineering, Cornell University 2 , Ithaca, New York 14853,

K

Karthick Gothandapani

Department of Materials Design and Innovation, University at Buffalo 1 , Buffalo, New York 14260,

H

Huili Grace Xing

Institute of Materials and Systems for Sustainability, Nagoya University 1 , Nagoya 464-8601,

D

Debdeep Jena

School of Electrical and Computer Engineering, Cornell University 2 , Ithaca, New York 14853,

B

Baishakhi Mazumder

Department of Materials Design and Innovation