Influence of heterovalent doping on tetrahedral N interstitial formation in dilute GaAsN alloys

J J. J. P. Cooper (Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,) M M. C. Carcassi (Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,) Z Z. Xi (Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,) D D. J. Womack (Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,) H H. D. L. McKenna (Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,) L L. Qi (Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,) R R. S. Goldman

Abstract

Dilute alloying of GaAs with N enables bandgap tuning for near-infrared to mid-infrared optoelectronic devices. However, non-substitutional N incorporation has been linked to lower absorption and emission efficiencies in dilute-nitride-alloy-based devices, especially in those containing heterovalent dopants. In this work, we examine the influence of heterovalent dopants on N incorporation mechanisms in dilute GaAs1−xNx alloys with N composition intentionally below the threshold composition for the formation of tetrahedral N interstitials (Ntetra) in undoped GaAs1−xNx. For undoped GaAs1−xNx, 20% of the N incorporates in non-substitutional sites, as (N-N)As and (N-As)As split interstitials. Interestingly, Si dopants induce the formation of Ntetra, while Be doping has a negligible effect on the interstitial type. Although elastic interactions due to opposite signs of the misfit volumes of Ntetra and NAs contribute to Ntetra incorporation above a threshold N composition, Si dopants reduce the threshold composition, due to the Fermi level-dependent stability of Ntetra.

Article Details

Volume / Issue Vol. 127, Issue 20
Published November 17, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

J

J. J. P. Cooper

Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,

M

M. C. Carcassi

Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,

Z

Z. Xi

Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,

D

D. J. Womack

Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,

H

H. D. L. McKenna

Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,

L

L. Qi

Department of Materials Science and Engineering, University of Michigan 1 , Ann Arbor, Michigan 48109-2136,

R

R. S. Goldman