Inductor-shunted matching circuits for enhanced frequency multiplexibility in RF single electron transistors in silicon

S S. Nishiyama (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8552,) R R. Mizokuchi (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro-ku, Tokyo 152-8552,) R R. Matsuda (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8552,) J J. Kamioka (Information Technology R & D Center, Mitsubishi Electric Corporation 2 , Kamakura, Kanagawa 247-8501,) J J. Yoneda (Department of Advanced Materials Science, University of Tokyo 3 , Kashiwa, Chiba 277-8561,) T T. Kodera (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro-ku, Tokyo 152-8552,)

Abstract

Frequency-multiplexed radio-frequency (RF) reflectometry is a promising technique for large-scale quantum dot-based qubit systems because it enables simultaneous readout of multiple qubits and helps to reduce the wiring density in peripheral circuits. However, in the conventional L-C-type matching circuits, resonator frequency tunability is limited by poor design flexibility of the shunt capacitance and hence the circuit. Recently, L-L-type matching circuits comprising a series and a shunt inductor have been proposed to address this issue. Here, we report RF reflectometry readout of silicon quantum dot-based charge sensors embedded in L-L-type circuits. We determine the inductance values for target resonance frequencies based on our equivalent circuit model that incorporates the parasitic elements of the inductors and demonstrate resonator frequency tunability of up to 1 GHz with 3-dB resonator bandwidths on the order of MHz. The measured conductance sensitivities, on the order of 10−5(e2/h)/Hz at 4 K, are only moderately dependent on the resonance frequency up to 630 MHz. These results highlight the prospects of L-L-type matching circuits for rapid and multiplex reflectometry readout of semiconductor spin qubits.

Article Details

Volume / Issue Vol. 126, Issue 9
Published March 01, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (6)

S

S. Nishiyama

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8552,

R

R. Mizokuchi

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro-ku, Tokyo 152-8552,

R

R. Matsuda

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro, Tokyo 152-8552,

J

J. Kamioka

Information Technology R & D Center, Mitsubishi Electric Corporation 2 , Kamakura, Kanagawa 247-8501,

J

J. Yoneda

Department of Advanced Materials Science, University of Tokyo 3 , Kashiwa, Chiba 277-8561,

T

T. Kodera

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Meguro-ku, Tokyo 152-8552,