InAs/InGaAs quantum dots with room temperature photoluminescence at 1380 nm by Sb surfactant-induced strain relaxation

B Bhavya Kondapavuluri (Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,) W Wei-Sheng Liu (Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,) K Kai-Yang Hsu (Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,) P Pin-Chih Liu (Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,) J Jhih-Han Lin (Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,) J Jen-Inn Chyi (Department of Electrical Engineering, National Central University 2 , Chung-Li 32001,)

Abstract

This study examined the effects of Sb exposure on the optical properties of InAs/InGaAs quantum dot-in-a-well (QDWELL) heterostructures. A two-step strain compensation scheme was employed, with InAs QDs embedded within an InGaAs matrix to reduce the compressive strain caused by lattice mismatch between InAs and GaAs. Subsequent post-growth Sb flux exposure further reduced strain and altered surface energetics, producing a pronounced redshift of the ground-state emission from 1310 to 1380 nm at room temperature with a narrow linewidth (<30 meV). Temperature-dependent photoluminescence measurements also showed an enhanced activation energy of approximately 288 meV, compared with 250 meV for the QDs without Sb exposure, indicating a deeper confinement potential arising from increased conduction and valence band offsets. These results suggest that this approach allows both strain and carrier confinement to be effectively tailored to enable wavelength tuning into the E-band, promising for QD-based long-wavelength optoelectronic devices.

Article Details

Volume / Issue Vol. 128, Issue 24
Published June 15, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (6)

B

Bhavya Kondapavuluri

Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,

W

Wei-Sheng Liu

Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,

K

Kai-Yang Hsu

Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,

P

Pin-Chih Liu

Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,

J

Jhih-Han Lin

Department of Electrical Engineering, Yuan Ze University 1 , Chung-Li 32003,

J

Jen-Inn Chyi

Department of Electrical Engineering, National Central University 2 , Chung-Li 32001,