High-temperature ferromagnetism and large anomalous Nernst effect above room temperature in (In,Fe)Sb ferromagnetic semiconductor

K Kota Ejiri (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , 2-12-1 Ookayama, Meguro, Tokyo 152-8550,) W Wentao Li S Shuzo Oeda (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , 2-12-1 Ookayama, Meguro, Tokyo 152-8550,) Y Yun Jaeyeon (Department of Electrical Engineering & Information Systems, The University of Tokyo 2 , 7-3-1 Hongo, Bunkyo, Tokyo 113-8656,) K Kota Iwakura (Department of Electrical Engineering & Information Systems, The University of Tokyo 2 , 7-3-1 Hongo, Bunkyo, Tokyo 113-8656,) M Masaaki Tanaka (Department of Electrical Engineering & Information Systems, The University of Tokyo 2 , 7-3-1 Hongo, Bunkyo, Tokyo 113-8656,) P Pham Nam Hai (Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Tokyo 152-8550,)

Abstract

While the room-temperature anomalous Nernst effect (ANE) has been intensively studied in various ferromagnetic metals, it has never been studied in ferromagnetic semiconductors (FMSs) due to their low Curie temperature (TC). In this work, by optimizing the growth condition, we have grown an n-type (In,Fe)Sb FMS thin film with high TC ∼ 460 K at the Fe concentration of 30%, which is the highest TC reported so far in n-type FMSs. Using the high-TC (In,Fe)Sb thin film, we observe ANE with a large thermopower SxyANE = −3.2 μV/K at 332 K and −1.3 μV/K at 447 K. The large ANE in (In,Fe)Sb at room temperature is comparable to those observed in Mn3Sn and Co2MnGa topological materials.

Article Details

Volume / Issue Vol. 128, Issue 11
Published March 16, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (7)

K

Kota Ejiri

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , 2-12-1 Ookayama, Meguro, Tokyo 152-8550,

W

Wentao Li

S

Shuzo Oeda

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , 2-12-1 Ookayama, Meguro, Tokyo 152-8550,

Y

Yun Jaeyeon

Department of Electrical Engineering & Information Systems, The University of Tokyo 2 , 7-3-1 Hongo, Bunkyo, Tokyo 113-8656,

K

Kota Iwakura

Department of Electrical Engineering & Information Systems, The University of Tokyo 2 , 7-3-1 Hongo, Bunkyo, Tokyo 113-8656,

M

Masaaki Tanaka

Department of Electrical Engineering & Information Systems, The University of Tokyo 2 , 7-3-1 Hongo, Bunkyo, Tokyo 113-8656,

P

Pham Nam Hai

Department of Electrical and Electronic Engineering, Institute of Science Tokyo 1 , Tokyo 152-8550,