High-resolution compact computational spectrometer using enhanced mode interference in a chaotic multimode fiber

Z Zhongming Huang (College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,) J Junrui Liang (College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,) Y Yanting Guo J Jun Ye J Junhong He (College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,) X Xiaoya Ma Y Yanzhao Ke (College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,) J Jun Li J Jiangming Xu (College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,) J Jinyong Leng (College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,) S Shilong Jin P Pu Zhou (College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,)

Abstract

The development of high-resolution, miniaturized, and cost-effective spectrometers remains a critical technical challenge. In this work, we demonstrate a high-resolution computational spectrometer by exploiting the chaotic effects induced in side-polished multimode fibers (MMFs). The polishing breaks the structural symmetry of the circular fiber, thereby efficiently exciting guided modes and causing chaos. By forming a 5-cm-long polished region, a spectral resolution of ∼0.5 nm is achieved, representing a one-third improvement over an unpolished MMF of the same length. Moreover, we develop a spectral reconstruction algorithm that integrates adaptive regularization and the Savitzky–Golay filter, enabling real-time reconstruction with enhanced accuracy and robustness. Compared to the Tikhonov regularization algorithm alone, the proposed method reduces the reconstruction error by 50%. This scheme, which leverages chaotic effects to enhance spectral resolution, offers an effective design strategy for developing high-resolution spectrometers.

Article Details

Volume / Issue Vol. 128, Issue 26
Published June 29, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (12)

Z

Zhongming Huang

College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,

J

Junrui Liang

College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,

Y

Yanting Guo

J

Jun Ye

J

Junhong He

College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,

X

Xiaoya Ma

Y

Yanzhao Ke

College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,

J

Jun Li

J

Jiangming Xu

College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,

J

Jinyong Leng

College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,

S

Shilong Jin

P

Pu Zhou

College of Advanced Disciplinary Studies, National University of Defense Technology 1 , Changsha 410073,