High-performance WSe2 Geiger avalanche photodetector from 405 to 808 nm
Abstract
Avalanche photodiodes are attractive for weak-light detection. However, conventional avalanche devices usually suffer from high breakdown voltage, large dark current, and a limited gain–noise trade-off, restricting their applications in low-power and ultrasensitive photodetection. Here, we report a Pt/WSe2/graphene asymmetric Schottky diode that exhibits bilateral Geiger-mode avalanche operation. It shows abrupt avalanche breakdown under both positive and negative biases, with room-temperature breakdown voltages of approximately +19.6 and −23.45 V, respectively. Owing to the asymmetric Schottky barriers and bias-induced band bending in ambipolar WSe2, the carrier injection terminal and high-field multiplication region can be switched by the bias polarity, enabling bilateral impact ionization in a two-terminal geometry. Temperature-dependent investigations from 100 to 300 K confirm stable bilateral avalanche operation, with the breakdown voltage increasing at lower temperatures due to the modulation of carrier acceleration and scattering. Under femtowatt-level illumination at room temperature, photogenerated carriers facilitate impact ionization and shift the avalanche threshold toward lower bias. The device exhibits avalanche gains of 1.11 × 105 and 1.25 × 104 under negative and positive bias, respectively, and enables weak-light detection over 405–808 nm. At 808 nm, the responsivity reaches 107 A W−1 and the specific detectivity reaches 1014 Jones. This work demonstrates that asymmetric Schottky-contact engineering combined with ambipolar WSe2 transport provides an effective strategy for high-gain, high-detectivity, and bidirectional two-dimensional avalanche photodetectors.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (7)
Xiangyu Chen
Tianjin Key Laboratory of Life and Health Detection, Life and Health Intelligent Research Institute
Xiangkai Liu
College of Materials Science and Engineering, Sichuan University , Chengdu 610054,
Zhicheng Lin
Minmin Zhao
College of Materials Science and Engineering, Sichuan University , Chengdu 610054,
Haijuan Wu
College of Materials Science and Engineering, Sichuan University , Chengdu 610054,
Chao Tan
Zegao Wang
College of Materials Science and Engineering, Sichuan University , Chengdu 610054,