Gate-induced electron transfer effects in monolithic Al–Ge–Al nanostructures

M Masiar Sistani (Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,) E Ezgi Tatli (Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,) L Lukas Wind (Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,) R Raphael Behrle (Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,) F François Lefloch S Sebastian Lellig (Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures 3 , CH-3602 Thun,) X Xavier Maeder (Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures 3 , CH-3602 Thun,) W Walter M. Weber (Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,) F F. Murphy-Armando (Tyndall National Institute, University College Cork 5 , Lee Maltings Complex Dyke Parade, Cork T12R5CP,) A Alois Lugstein

Abstract

Germanium (Ge) is recognized as a highly promising substrate for a broad spectrum of electronic, optical, and quantum applications, owing to its exceptional properties, including high charge carrier mobility, strong spin-orbit coupling, and its behavior as a quasi-direct semiconductor. However, the electron transfer effect in Ge, similar to the Gunn effect in GaAs, which induces negative differential resistance, has received relatively little attention thus far. This is likely due to the requirement for a well-defined material system and device architecture for its realization and usually at low temperatures.

Article Details

Volume / Issue Vol. 126, Issue 25
Published June 23, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (10)

M

Masiar Sistani

Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,

E

Ezgi Tatli

Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,

L

Lukas Wind

Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,

R

Raphael Behrle

Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,

F

François Lefloch

S

Sebastian Lellig

Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures 3 , CH-3602 Thun,

X

Xavier Maeder

Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures 3 , CH-3602 Thun,

W

Walter M. Weber

Institute of Solid State Electronics, Technische Universität Wien 1 , Gußhausstraße 25-25a, 1040 Vienna,

F

F. Murphy-Armando

Tyndall National Institute, University College Cork 5 , Lee Maltings Complex Dyke Parade, Cork T12R5CP,

A

Alois Lugstein