Fast and sensitive visible–infrared detection using Bi2O2Se/WS2 heterostructure
Abstract
Photodetectors play a vital role in optical imaging, communication, security monitoring, and environmental sensing. With the rapid advancement of artificial intelligence and autonomous driving, there is an increasing demand for devices exhibiting broadband absorption, high sensitivity, low-power consumption, and fast response. However, the inherent limitations of their band structures restrict conventional thin-film photodetectors to narrow spectral ranges, resulting in suboptimal broadband performance. Herein, we showcase a broadband photodetector constructed from a Bi2O2Se/WS2 van der Waals heterostructure. The built-in electric field arising from band alignment enables effective directional separation and transport of photogenerated electron–hole pairs, suppressing recombination, reducing dark current, and boosting photoelectric conversion efficiency. As a result, the device achieves broadband detection spanning 520–1550 nm at room temperature, featuring a picoampere-level dark current, a high detectivity of 2.4 × 1012 Jones, and a fast response time of 27 μs. Our results offer a promising approach for multi-band imaging applications and device miniaturization.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (9)
Kongyou Wang
School of Resources and Environmental Engineering, East China University of Science and Technology 1 , Shanghai 200237,
Zhen-Zhi Hu
School of Physics and Optoelectronic Engineering, Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences 2 , No. 1, Sub-Lane Xiangshan, Xihu District, Hangzhou 310024,
Sheng Ni
Fengyi Zhu
School of Physics and Optoelectronic Engineering, Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences 2 , No. 1, Sub-Lane Xiangshan, Xihu District, Hangzhou 310024,
Haoxuan Li
State Key Laboratory of Multiphase Flow in Power Engineering, Xi’an Jiaotong University 1 , Xi’an, Shaanxi 710049,
Shian Mi
School of Physics and Optoelectronic Engineering, Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences 2 , No. 1, Sub-Lane Xiangshan, Xihu District, Hangzhou 310024,
Xuhao Fan
Yuhang Ma
Changyi Pan
School of Physics and Optoelectronic Engineering, Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences 2 , No. 1, Sub-Lane Xiangshan, Xihu District, Hangzhou 310024,