Evaluation of exchange stiffness constant in iron garnet film using micromagnetic simulation

T Takumi Koguchi (Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,) T Toshiaki Watanabe H Hibiki Miyashita (Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,) K Kazushi Ishiyama (Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,) Y Yuichi Nakamura (Toyohashi University of Technology 3 , 1-1 Hibarigaoka, Tempaku, Toyohashi, Aichi 441-8580,) M Mitsuteru Inoue (Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,) M Mehmet C. Onbasli (Electrical and Electronics Engineering and Physics, Koç University 5 , Rumelifeneri Yolu 34450, Sariyer, Istanbul,) T Taichi Goto

Abstract

Measurement of exchange stiffness constants (ESCs) is crucial for describing magnetization phenomena. Large-scale micromagnetic simulations (MMSs) are used to determine the ESC of iron garnet thin films exhibiting perpendicular magnetic anisotropy. The ESC determined by fitting the calculated domain periodicity with experimental data acquired through a polarized microscope is comparable to previously reported values. In addition, the simulations showed mixed-configuration domain wall (DW) structure with a large Néel–Bloch DW ratio. This study demonstrates the capability of MMS for evaluating ESCs while providing additional insights into DW physics, offering a facile approach for describing spin dynamics in magnetic garnets.

Article Details

Volume / Issue Vol. 127, Issue 10
Published September 08, 2025
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (8)

T

Takumi Koguchi

Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,

T

Toshiaki Watanabe

H

Hibiki Miyashita

Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,

K

Kazushi Ishiyama

Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,

Y

Yuichi Nakamura

Toyohashi University of Technology 3 , 1-1 Hibarigaoka, Tempaku, Toyohashi, Aichi 441-8580,

M

Mitsuteru Inoue

Research Institute of Electrical Communication, Tohoku University 1 , 2-1-1 Katahira, Aoba, Sendai, Miyagi 980-8577,

M

Mehmet C. Onbasli

Electrical and Electronics Engineering and Physics, Koç University 5 , Rumelifeneri Yolu 34450, Sariyer, Istanbul,

T

Taichi Goto