Erratum: “Thickness-dependent optical and structural properties of chalcogenide phase-change memory thin films grown at room temperature by pulsed laser deposition” [Appl. Phys. Lett. <b>127</b> , 201603 (2025)]

K Kostiantyn Shportko (V.E. Lashkaryov Institute of Semiconductor Physics of NAS of Ukraine 1 , Nauki av., 41, Kyiv,) S Sonja Cremer (Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,) A Andriy Lotnyk (Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,)

Article Details

Volume / Issue Vol. 129, Issue 1
Published July 06, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (3)

K

Kostiantyn Shportko

V.E. Lashkaryov Institute of Semiconductor Physics of NAS of Ukraine 1 , Nauki av., 41, Kyiv,

S

Sonja Cremer

Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,

A

Andriy Lotnyk

Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,