Erratum: “Thickness-dependent optical and structural properties of chalcogenide phase-change memory thin films grown at room temperature by pulsed laser deposition” [Appl. Phys. Lett. <b>127</b> , 201603 (2025)]
K
Kostiantyn Shportko
(V.E. Lashkaryov Institute of Semiconductor Physics of NAS of Ukraine 1 , Nauki av., 41, Kyiv,)
S
Sonja Cremer
(Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,)
A
Andriy Lotnyk
(Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,)
Article Details
Journal
Applied Physics Letters
Volume / Issue
Vol. 129, Issue 1
Published
July 06, 2026
ISSN
0003-6951
Publisher
American Institute of Physics
Journal Info
Applied Physics Letters
American Institute of Physics
ISSN: 0003-6951 Physical Sciences
Authors (3)
K
Kostiantyn Shportko
V.E. Lashkaryov Institute of Semiconductor Physics of NAS of Ukraine 1 , Nauki av., 41, Kyiv,
S
Sonja Cremer
Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,
A
Andriy Lotnyk
Leibniz Institute of Surface Engineering (IOM) 2 , Permoserstr. 15, 04318 Leipzig,
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