Enhanced photocurrent and responsivity of Bi2O2Se nanosheet near-infrared photodetector by <i>in situ</i> surface growth of Te nanowires

G Guangcan Wang (School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,) S Siying Gao (School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,) Y Yinghui Sun Z Zixu Sa (School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,) P Pengsheng Li (School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,) Y Yanxue Yin (State Key Laboratory of Superhard Materials Synergetic Extreme Condition High‐Pressure Science Center College of Physics Jilin University 2699 Qianjin Street Changchun 130012 P.R. China) Y You Meng (Department of Materials Science and Engineering) S SenPo Yip (Institute for Materials Chemistry and Engineering) Z Zai-xing Yang (School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,)

Abstract

The intrinsically weak optical absorption and limited photocarrier separation of atomically thin two-dimensional (2D) materials often limit the photodetector performance. Here, we report an in situ surface growth strategy for preparing a Bi2O2Se/Te heterojunction via a low-temperature chemical vapor deposition method. One-dimensional Te nanowires directly grow on 2D Bi2O2Se nanosheets, forming a clean van der Waals interface and enhancing optical absorption capacity. The Bi2O2Se/Te heterostructure exhibits excellent optoelectronic performance, including an enhanced photocurrent of 1.12 μA, a high responsivity of 50 A/W, and a fast response speed of 32/&amp;gt;168 ms. The enhanced photocurrent and responsivity arise from the efficient electron injection from Te to Bi2O2Se, and hole trapping at the heterointerface. This work demonstrates a non-destructive approach for preparing high-quality heterojunctions and provides an effective pathway for next-generation high-performance near-infrared photodetectors.

Article Details

Volume / Issue Vol. 128, Issue 2
Published January 12, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (9)

G

Guangcan Wang

School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,

S

Siying Gao

School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,

Y

Yinghui Sun

Z

Zixu Sa

School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,

P

Pengsheng Li

School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,

Y

Yanxue Yin

State Key Laboratory of Superhard Materials Synergetic Extreme Condition High‐Pressure Science Center College of Physics Jilin University 2699 Qianjin Street Changchun 130012 P.R. China

Y

You Meng

Department of Materials Science and Engineering

S

SenPo Yip

Institute for Materials Chemistry and Engineering

Z

Zai-xing Yang

School of Physics, State Key Laboratory of Crystal Materials, Shandong University 1 , Jinan 250100,