Enhanced electrical properties of flexible AlGaN/GaN HEMT arrays via stress engineering
Abstract
Wide-bandgap semiconductors, by virtue of their superior electrical and mechanical properties, enable significant performance enhancements in flexible electronics. Here, we report flexible AlGaN/GaN high-electron-mobility transistor (HEMT) arrays fabricated through deep silicon etching and wafer-scale substrate transfer processes. The flexible AlGaN/GaN HEMT devices demonstrate a maximum saturated drain current density of 166.5 mA/mm at VGS = 1 V and a peak transconductance of 42.6 mS/mm at VDS = 5 V, along with notable tolerance to mechanical deformation. Moreover, under in-plane tensile strain, the devices exhibit improved electrical performance. This enhancement is attributed to the modulation of the two-dimensional electron gas density at the AlGaN/GaN heterointerface driven by strain-induced piezoelectric polarization. These favorable characteristics underscore the strong potential of HEMTs for next-generation flexible electronic applications, particularly in fields such as biosensing, smart wearable technology, human–machine interactions, and intelligent microsystems.
Article Details
Journal Info
Applied Physics Letters
American Institute of Physics
Authors (5)
Xiu Zhang
Wei Ling
Junchen Liu
Hu Tao
Tao Tang