Effect of Mn-doping on high field energy storage properties of Ag(Nb,Ta)O3 epitaxial films on ⟨100⟩ SrTiO3

J J. Leber (The Glenn Howatt Electronic Ceramics Laboratory, Department of Materials Science and Engineering, Rutgers-The State University of New Jersey , Piscataway, New Jersey 08854,) E E. K. Akdoğan (The Glenn Howatt Electronic Ceramics Laboratory, Department of Materials Science and Engineering, Rutgers-The State University of New Jersey , Piscataway, New Jersey 08854,) A A. Safari (The Glenn Howatt Electronic Ceramics Laboratory, Department of Materials Science and Engineering, Rutgers-The State University of New Jersey , Piscataway, New Jersey 08854,)

Abstract

Single-phase epitaxial thin films of pure and 0.5 mol. % Mn-doped perovskite Ag(Nb0.45Ta0.55)O3 (ANT) were prepared by pulsed laser deposition on ⟨001⟩ oriented SrTiO3 substrates with (La0.5, Sr0.5)CoO3 bottom electrodes. Films of 195–245 nm thickness with smooth surface morphology were obtained. Mn-doping improved high field leakage current both by reducing electrical conductivity and by improving the onset electric field from 125 to 300 kV/cm, where conductivity diverges precipitously. The increase in the onset electric field is attributed to the donor dopant behavior of Mn by substitution on the perovskite A-site, counteracting the native p-type conductivity of ANT due to Ag-deficiency. Oxygen annealing of both films at 1 atm, 500 °C for 1 h drastically decreased the loss tangent while having a modest effect on the permittivity in the Mn-doped films. Hysteresis (PE) loops with applied electric fields up to 1200 kV/cm were obtained in Mn-doped films for which Pmax = 14.8 μC/cm2 and Wrec = 5.6 J/cm3 with η = 80%, which shows great improvement in energy storage properties compared to undoped ANT epitaxial thin films.

Article Details

Volume / Issue Vol. 128, Issue 6
Published February 09, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (3)

J

J. Leber

The Glenn Howatt Electronic Ceramics Laboratory, Department of Materials Science and Engineering, Rutgers-The State University of New Jersey , Piscataway, New Jersey 08854,

E

E. K. Akdoğan

The Glenn Howatt Electronic Ceramics Laboratory, Department of Materials Science and Engineering, Rutgers-The State University of New Jersey , Piscataway, New Jersey 08854,

A

A. Safari

The Glenn Howatt Electronic Ceramics Laboratory, Department of Materials Science and Engineering, Rutgers-The State University of New Jersey , Piscataway, New Jersey 08854,