Journal of the American Chemical Society

Direct Probing the Electrical Double Layer at Graphite/Nafion Interface via Depth Profiling APXPS

Y Yijing Zang (Center for Transformative Science & School of Physical Science and Technology) S Shucheng Shi (School of Physical Science and Technology; Center for Transformative Science) J Jian Liu J Jun Cai (School of Physical Science and Technology) Y YONG HAN N Ning Sun (Frontiers Science Center for Transformative Molecules, School of Chemistry and Chemical Engineering, Zhangjiang Institute for Advanced Study) Y Yunhong Luo (School of Physical Science and Technology) S Shandong Zhu (School of Physical Science and Technology) B Bo Yang H Hui Zhang (The Fourth Hospital of Hebei Medical University Shijiazhuang China) Y Yimin Li (Center for Transformative Science & School of Physical Science and Technology) Z Zhi Liu (Laboratory of Atmospheric Environment and Pollution Control)
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Article Details

Volume / Issue Vol. 147, Issue 37
Published September 17, 2025
Pages 33366-33371
ISSN 0002-7863
Publisher American Chemical Society

Journal Info

Journal of the American Chemical Society

American Chemical Society
ISSN: 0002-7863 Physical Sciences

Authors (12)

Y

Yijing Zang

Center for Transformative Science & School of Physical Science and Technology

S

Shucheng Shi

School of Physical Science and Technology; Center for Transformative Science

J

Jian Liu

J

Jun Cai

School of Physical Science and Technology

Y

YONG HAN

N

Ning Sun

Frontiers Science Center for Transformative Molecules, School of Chemistry and Chemical Engineering, Zhangjiang Institute for Advanced Study

Y

Yunhong Luo

School of Physical Science and Technology

S

Shandong Zhu

School of Physical Science and Technology

B

Bo Yang

H

Hui Zhang

The Fourth Hospital of Hebei Medical University Shijiazhuang China

Y

Yimin Li

Center for Transformative Science & School of Physical Science and Technology

Z

Zhi Liu

Laboratory of Atmospheric Environment and Pollution Control

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