Zang, Y., Shi, S., Liu, J., Cai, J., HAN, Y., Sun, N., Luo, Y., Zhu, S., Yang, B., Zhang, H., Li, Y., Liu, Z. (2025). Direct Probing the Electrical Double Layer at Graphite/Nafion Interface via Depth Profiling APXPS. Journal of the American Chemical Society. https://doi.org/10.1021/jacs.5c11569