Direct Probing the Electrical Double Layer at Graphite/Nafion Interface via Depth Profiling APXPS - Yijing Zang; Shucheng Shi; Jian Liu; Jun Cai; YONG HAN; Ning Sun; Yunhong Luo; Shandong Zhu; Bo Yang; Hui Zhang; Yimin Li; Zhi Liu (Journal of the American Chemical Society, 2025)