Direct Fourier-plane imaging with enhanced depth of field via cross-phase modulation

P Pujuan Ma (Shandong Provincial Key Laboratory of Light Field Manipulation Physics and Applications & School of Physics and Optoelectronics, Shandong Normal University 1 , Jinan 250358,) A Ao Zhou Y Yifei Li (Institute of Physics, Laboratory of Optical Physics) Y Yanlin Bai (Shandong Provincial Key Laboratory of Light Field Manipulation Physics and Applications & School of Physics and Optoelectronics, Shandong Normal University 1 , Jinan 250358,) X Xiaofeng Peng (Shandong Provincial Key Laboratory of Light Field Manipulation Physics and Applications & School of Physics and Optoelectronics, Shandong Normal University , Jinan 250358,) X Xin Liu C Chunhao Liang Q Quanying Wu (Key Laboratory of Efficient Low-carbon Energy Conversion and Utilization of Jiangsu Provincial Higher Education Institutions, School of Physical Science and Technology, Suzhou University of Science and Technology 1 , Suzhou 215009,) Y Yangjian Cai Q Qian Chen

Abstract

Optical imaging plays a critical role in various fields, such as biomedical imaging, remote sensing, and environmental monitoring, enabling high-resolution, non-contact, and multidimensional data acquisition. However, many advanced imaging techniques face challenges, including complex optical setups and stringent calibration requirements. In this work, we propose an optical imaging method that combines the simplicity of the classical 4f system with cross-phase modulation applied to the illumination source, enabling direct spectral-domain imaging. By increasing the phase-strength parameter, we improve the system's depth of field and reduce its sensitivity to longitudinal deviations. We further demonstrate that by reducing the coherence of the illumination source, the proposed system effectively suppresses coherent artifacts and enhances image quality. Experimental results are in excellent agreement with theoretical predictions, validating the effectiveness and robustness of our approach. This method offers some perspectives for optical sensing and detection applications.

Article Details

Volume / Issue Vol. 128, Issue 5
Published February 02, 2026
ISSN 0003-6951
Publisher American Institute of Physics

Journal Info

Applied Physics Letters

American Institute of Physics

ISSN: 0003-6951 Physical Sciences

Authors (10)

P

Pujuan Ma

Shandong Provincial Key Laboratory of Light Field Manipulation Physics and Applications & School of Physics and Optoelectronics, Shandong Normal University 1 , Jinan 250358,

A

Ao Zhou

Y

Yifei Li

Institute of Physics, Laboratory of Optical Physics

Y

Yanlin Bai

Shandong Provincial Key Laboratory of Light Field Manipulation Physics and Applications & School of Physics and Optoelectronics, Shandong Normal University 1 , Jinan 250358,

X

Xiaofeng Peng

Shandong Provincial Key Laboratory of Light Field Manipulation Physics and Applications & School of Physics and Optoelectronics, Shandong Normal University , Jinan 250358,

X

Xin Liu

C

Chunhao Liang

Q

Quanying Wu

Key Laboratory of Efficient Low-carbon Energy Conversion and Utilization of Jiangsu Provincial Higher Education Institutions, School of Physical Science and Technology, Suzhou University of Science and Technology 1 , Suzhou 215009,

Y

Yangjian Cai

Q

Qian Chen